2015
DOI: 10.21236/ada626921
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Theoretical Prediction of the Heats of Formation, Densities and Relative Sensitivities, and/or Synthetic Approaches Toward the Synthesis of High Energy Dense Materials (HEDMs): 3,5-Dinitro-1,3,5-Oxadiazinane, Bis-Adjacent RDX, Bis-Adjacent HMX, 4,4',6,6'-Tetranitro-1,1'-Bis(N-oxide)-5,5',6,6'-4H,4'H-5,5'-Bisimidazo Oxadiazole, and the Open-Cage Derivative of CL-20

Abstract: Public reporting burden for this collection of information is estimated to average 1 hour per response, including the time for reviewing instructions, searching existing data sources, gathering and maintaining the data needed, and completing and reviewing the collection information. Send comments regarding this burden estimate or any other aspect of this collection of information, including suggestions for reducing the burden, to Department of Defense, Washington Headquarters Services, Directorate for Informat… Show more

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(2 citation statements)
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“…DOD is a structural analogue of RDX, which was first isolated as a byproduct during the synthesis of RDX. Several researchers have reported on its synthesis, crystal structure, and characterization. DOD exhibits a calculated ρ = 1700 kg/m 3 and Δ H f 0 = −9 2.9 kJ/mol at 298 K, with P CJ = 27.51 GPa and D v = 8.10 km/s …”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…DOD is a structural analogue of RDX, which was first isolated as a byproduct during the synthesis of RDX. Several researchers have reported on its synthesis, crystal structure, and characterization. DOD exhibits a calculated ρ = 1700 kg/m 3 and Δ H f 0 = −9 2.9 kJ/mol at 298 K, with P CJ = 27.51 GPa and D v = 8.10 km/s …”
Section: Introductionmentioning
confidence: 99%
“…34−41 DOD exhibits a calculated ρ = 1700 kg/m 3 and ΔH f 0 = −9 2.9 kJ/mol at 298 K, with P CJ = 27.51 GPa and D v = 8.10 km/s. 34 Experimental techniques and modeling tools often help identify, characterize, and evaluate new materials, as well as predict their performance. Single-crystal X-ray diffractometry (SC-XRD) and Raman spectroscopy are two powerful techniques for material characterization because they are accurate, nondestructive, and require a few milligrams of sample.…”
Section: ■ Introductionmentioning
confidence: 99%