Theory of noncontact dissipation force microscopy

Gauthier, Michel; Tsukada, Masaru

doi:10.1103/physrevb.60.11716

Cited by 106 publications

(129 citation statements)

References 16 publications

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“…4,[22][23][24][25][26] Since the tip does not touch the sample, a question rises on the physical origin of the increase of the loss of energy. A few recent works have been specially dedicated to the study of the microlever energy loss in NC-AFM.…”

Section: Introductionmentioning

confidence: 99%

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Influence of noncontact dissipation in the tapping mode: Attempt to extract quantitative information on the surface properties with the local force probe method

Aimé

Boisgard

Nony

et al. 2001

The Journal of Chemical Physics

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In the Tapping mode, a variation of the oscillation amplitude and phase as a function of the tip sample distance is the necessary measurement to access quantitatively to the properties of the surface. In the present work, we give a systematic comparison between experimental data recorded on two surfaces, phase and amplitude, and theoretical curves. With an interaction between the tip and the surface taking into account an attractive and a repulsive term, the analytical approach is unable to properly describe the relationship between the phase variation and the oscillation amplitude variation. When an additional dissipation term is involved, due to the attractive interaction between the tip and the surface, the model gives a good agreement with the recorded data. Particularly, the trends in the phase variations related to the noncontact situations have been found to be amenable to an analysis based upon a simple viscoelastic behavior of the surface. ͓͔

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Section: Introductionmentioning

confidence: 99%

“…A few recent works have been specially dedicated to the study of the microlever energy loss in NC-AFM. [22][23][24][25][26] In Ref. 26, the local deformation of the sample under the action of the oscillating tip is considered as being the leading term to explain the physical origin of the additional dissipation.…”

Section: Introductionmentioning

confidence: 99%

Influence of noncontact dissipation in the tapping mode: Attempt to extract quantitative information on the surface properties with the local force probe method

Aimé

Boisgard

Nony

et al. 2001

The Journal of Chemical Physics

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“…In principle, the damping signal could unleash important information about the surface such as that related to the phonon local density of states in complete analogy with STM [18,19], although preliminary studies indicate that its magnitude is small compared to those reported in experiments. A number of mechanisms such as adhesion hysteresis [10,20 -22] or Joule dissipation have been proposed to account for the large damping measured in experiments but many qualitative effects remain outstanding.…”

mentioning

confidence: 97%

“…(2)]. Figure 4 shows what happens when a viscous dissipation process [18] exists for different values of I and P. In all cases, the resonance persists, although the peak height, position, and width are all related to the specific values of I and P. For very slow scan, the contrast is normal and the damping corrugation is independent of I and P. For faster scan, however, real dissipation is convoluted with the system operation; the change of the corrugation does not result from a change in the dissipation but is related to the way the amplitude is dynamically regulated. This unequivocally demonstrates the existence of an apparent dissipation mechanism in FM-AFM.…”

Section: Volume 89 Number 14 P H Y S I C a L R E V I E W L E T T E Rmentioning

confidence: 99%

“…For example, a small shift or even a contrast inversion is often observed between topographical and damping images for constant frequency shift scan [14 -17]. Based on existing theoretical evidences, both adhesion hysteresis [21] and stochastic dissipation [18] predict a (in phase) normal contrast because the dissipation is caused by interatomic interaction and is more sensitive to the separation than the frequency shift signal itself. Joule dissipation should be expected to be rather small on lossless dielectric and metallic surfaces.…”

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Interplay between Nonlinearity, Scan Speed, Damping, and Electronics in Frequency Modulation Atomic-Force Microscopy

et al. 2002

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Numerical simulations of the frequency modulation atomic force microscope, including the whole dynamical regulation by the electronics, show that the cantilever dynamics is conditionally stable and that there is a direct link between the frequency shift and the conservative tip-sample interaction. However, a soft coupling between the electronics and the nonlinearity of the interaction may significantly affect the damping. A resonance between the scan speed and the response time of the system can provide a simple explanation for the spatial shift and contrast inversion between topographical and damping images, and for the extreme sensitivity of the damping to a tip change. DOI: 10.1103/PhysRevLett.89.146104 PACS numbers: 68.37.Ef, 07.79.Lh, 87.64.Dz The rapid advance in nanoscale physics has constantly triggered innovative refinement of tools for detecting novel atomic scale phenomena. Scanning tunneling microscopy (STM) [1] exploits the exponential distance decay of the tip-sample tunneling current, and its confinement to the foremost atoms of the tip can provide atomically resolved images of conducting surfaces. Atomic force microscopy (AFM) [2] was devised to extend these capabilities to more general surfaces but the tip-sample contact area is often too large to permit atomic resolution. To remedy the situation, the amplitude modulation (AM) technique [3] (also known as tapping mode), where the change in amplitude of a vibrating cantilever due to the interaction is used for imaging the sample, has been adapted for AFM. However, the nonlinearity of the tipsample force can lead to a complicated dynamical behavior [4] because two stable oscillation states coexist in many situations of interest.Frequency modulation (FM) AFM [5] (also called noncontact AFM) has achieved the long-standing goal of true atomic resolution with AFM in UHV [6,7], as well as the direct measurement of the covalent bonding between the tip apex and sample atoms [8]. In FM-AFM, the dynamical system is more complicated because the oscillation amplitude of the cantilever is kept constant and the separation is regulated by measuring the change in the resonance frequency of the cantilever caused by the interaction force. Because the cantilever motion is highly sinusoidal, the measured frequency shift can be related to the interaction using perturbation theory [9][10][11].In FM-AFM, the amount of excitation necessary to keep the oscillation amplitude constant (damping signal) can also be used as an imaging signal [12 -17], but its magnitude and characteristics have been more difficult to quantify and interpret than the frequency shift. In principle, the damping signal could unleash important information about the surface such as that related to the phonon local density of states in complete analogy with STM [18,19], although preliminary studies indicate that its magnitude is small compared to those reported in experiments. A number of mechanisms such as adhesion hysteresis [10,20 -22] or Joule dissipation have been proposed to account for the...

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Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations

et al. 2001

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Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7×7) surface is studied by AFM with various tips and AFM images are simulated with chemical and electrostatic model forces. The calculation of images from the tip-sample forces is explained in detail and the implications of the imaging parameters are discussed. Because the structure of the Si(111)-(7×7) surface is known very well, the shape of the adatom images is used to determine the tip structure. The observability of atomic orbitals by AFM and scanning tunneling microscopy is discussed.

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Theory of noncontact dissipation force microscopy

Cited by 106 publications

References 16 publications

Influence of noncontact dissipation in the tapping mode: Attempt to extract quantitative information on the surface properties with the local force probe method

Influence of noncontact dissipation in the tapping mode: Attempt to extract quantitative information on the surface properties with the local force probe method

Interplay between Nonlinearity, Scan Speed, Damping, and Electronics in Frequency Modulation Atomic-Force Microscopy

Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations

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