Theory of the effect of supercurrents on the low-voltage resistance of superconductor<i>–</i>insulator<i>–</i>normal-metal tunnel junctions

Lemberger, Thomas R.; Yen, Yeouchung; Lee, Soon-Gul

doi:10.1103/physrevb.35.6670

Cited by 12 publications

(1 citation statement)

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“…The intrinsic processes of e-e scattering and thermal phase fluctuations determine the magnitude of R, since they determine r + [Eqs. (2) and (3)]. An extrinsic pair breaker, i.e.…”

Section: Resultsmentioning

confidence: 99%

Electron-electron scattering and phase fluctuations in superconducting films

Lee¹,

Lemberger²

1989

Phys. Rev. B

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The effects of weak disorder on superconducting aluminum films pre studied over temperatures 0.4T,~T~0.98T, and resistances per square of 1.7~R&~22 Q. The primary effects of disorder are found to be disorder-enhanced electron-electron scattering and thermal phase, or supercurrent fluctuations, both of which cause pair-breaking effects. This conclusion is drawn from measurement of the low-voltage resistance of low-resistance superconductorinsulatornormal-metal (SIN) tunnel junctions with aluminum as the S electrode. The effective pair-breaking rates from both processes, evaluated at T"increases linearly with RD, in semiquantitative agreement with model calculations. The electron-electron scattering rate decreases very rapidly as T decreases below T" in agreement with theory. The pair-breaking rate from phase fluctuations decreases roughly linearly with decreasing temperature. Although distinct effects, phase fluctuations, and ele'ctron-electron scattering share a common origin in electron-density fluctuations, which are enhanced by disorder.A microscopic theory of disordered superconductors incorporating both electron-electron scattering and thermal phase fluctuations is needed.

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“…The intrinsic processes of e-e scattering and thermal phase fluctuations determine the magnitude of R, since they determine r + [Eqs. (2) and (3)]. An extrinsic pair breaker, i.e.…”

Section: Resultsmentioning

confidence: 99%