Abstract:Abstract-Solar cell material GaN films were grown on 6H-SiC by metalorganic chemical vapor deposition (MOCVD).An in situ SiNx interlayer was employed during the growth process, which acted as a nano-mask to promote epitaxial lateral overgrowth. The threading dislocations (TDs) density in the films may be reduced to 1.7×108 cm−2 by the SiNx interlayer. The TD reduction method relies on the formation of facetted islands on the SiNx-treated GaN surface. Some TDs bend to the facets of GaN islands, some TDs with an… Show more
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