2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) 2015
DOI: 10.1109/pvsc.2015.7355668
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Thermal and electrical effects of partial shade in monolithic thin-film photovoltaic modules

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Cited by 13 publications
(28 citation statements)
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“…Electron-beam- Table 2 and were taken from previous studies. 3,7,8 3 | CHARACTERIZATION OF REVERSE-BIAS BREAKDOWN SITES…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…Electron-beam- Table 2 and were taken from previous studies. 3,7,8 3 | CHARACTERIZATION OF REVERSE-BIAS BREAKDOWN SITES…”
Section: Methodsmentioning
confidence: 99%
“…As shown in Figure 10, the ignition event, which can be hot enough to melt CIGS, occurs within a few seconds, as suggested by our DLIT images and other observations. 1,3,4,10 The melting point of CIGS ranges from 1260 to 1340 K depending on the Ga content. 12 There is also signifi- Figure 11A,B.…”
Section: Thermal Runawaymentioning
confidence: 99%
See 1 more Smart Citation
“…Hence, the recommended measurement window of MPP data can be up several days (eg, 3 days in Figure 4), as long as there exists sufficient variation in illumination and temperature to reconstruct the MPP IV. In the case of catastrophic degradation (such as partial shading degradation in thin-film solar modules 32 ), the extracted circuit parameters become the average of pre-degradation and post-degradation values over time. Because the short-circuit current may fluctuate significantly because of soiling and precipitation, the upper and lower bounds thereof are set to be the datasheet short-circuit current and zero, respectively.…”
Section: Step 3: Preprocessing Mpp Datamentioning
confidence: 99%
“…The underlying physical degradation mechanisms of PV are strongly contingent on local meteorological factors and different technologies, eg, solar modules exposed in humid regions are more susceptible to contact corrosion, 46 and monolithic thin-film solar modules are vulnerable to partial shading degradation. 32 Similarly, modules more likely to suffer from PID should adopt Corning ® Willow ™ Glass to impede ion migration. 47 Therefore, ideally, module design ought to be geography and technology dependent.…”
Section: Geography-specific and Technology-specific Reliability-awamentioning
confidence: 99%