1998
DOI: 10.1116/1.581451
|View full text |Cite
|
Sign up to set email alerts
|

Thermal and electron-driven chemistry of CCl4 on clean and hydrogen precovered Si(100)

Abstract: The thermal and electron activated properties of CCl4 on Si(100), with and without adsorbed hydrogen, have been investigated in the temperature range 100–1100 K using temperature programmed desorption (TPD), electron stimulated desorption, and x-ray photoelectron spectroscopy. Dosed at 100 K but not exposed to electrons, molecular CCl4 desorbs from both surfaces between 120 and 170 K with coverage-dependent monolayer and multilayer peaks. An etching product, SiCl2 desorbs from Si(100), but not H–Si(100). Elect… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
23
0

Year Published

2005
2005
2020
2020

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 13 publications
(23 citation statements)
references
References 44 publications
0
23
0
Order By: Relevance
“…The nearly identical profile shapes of these higher-temperature features of masses 98 and 63 (with an intensity ratio of 1.8 for mass 63 to mass 98) for iso- DCE also indicate that they originate from the same desorption product. Because SiCl 2 + (mass 98) and SiCl + (mass 63) are found to be in comparable amounts from electron impact studies of gaseous SiCl 2 , , the parent desorption species is likely SiCl 2 . In our TDS experiments for iso- DCE and MCE, we have also monitored but found no mass 133, corresponding to SiCl 3 + of the heavier etching product SiCl 4 , confirming SiCl 2 as the main etching product.…”
Section: Resultsmentioning
confidence: 98%
“…The nearly identical profile shapes of these higher-temperature features of masses 98 and 63 (with an intensity ratio of 1.8 for mass 63 to mass 98) for iso- DCE also indicate that they originate from the same desorption product. Because SiCl 2 + (mass 98) and SiCl + (mass 63) are found to be in comparable amounts from electron impact studies of gaseous SiCl 2 , , the parent desorption species is likely SiCl 2 . In our TDS experiments for iso- DCE and MCE, we have also monitored but found no mass 133, corresponding to SiCl 3 + of the heavier etching product SiCl 4 , confirming SiCl 2 as the main etching product.…”
Section: Resultsmentioning
confidence: 98%
“…The nearly identical profiles with similar desorption maxima for the mass 98 and mass 63 TDS features (with an intensity ratio of 1:1.8) also indicate that they originate from the same desorption product. Because SiCl þ 2 and SiCl + are found to be in comparable amounts from electron impact studies of gaseous SiCl 2 [34,35], the parent desorption species is likely SiCl 2 . Furthermore, we have also monitored mass 133, corresponding to SiCl þ 3 of the heavier etching product SiCl 4 , but found no desorption feature, confirming SiCl 2 as the main etching product.…”
Section: Temperature (K)mentioning
confidence: 97%
“…They show an important yield at around 160 K related to the desorption of different species. The desorption temperature of CCl 4 depends on the nature of the surface and film thickness, e.g., 142 K on H-Si(100) 40 or 165 K (three-layer-thick film) on Ru. 32 The detected species in Figure 1 are attributed to the cracking of CCl 4 in the mass spectrometer.…”
Section: ■ Results and Discussionmentioning
confidence: 99%