Thermal and optical properties of PMMA films reinforced with Nb2O5 nanoparticles

Hajduk, Barbara; Bednarski, Henryk; Jarka, P.; Janeczek, Henryk; Godzierz, Marcin; Tański, Tomasz

doi:10.1038/s41598-021-01282-7

Cited by 22 publications

(12 citation statements)

References 55 publications

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“…Thermal analysis was performed in two ways: using variable-temperature spectroscopic ellipsometry and differential scanning calorimetry. As in our previous works [ 29 , 30 , 31 , 32 ], here we present the variability of the ellipsometric angle Δ as a function of temperature for one selected wavelength. In this case, λ = 900 nm, due to the low dispersion of the measured points.…”

Section: Resultsmentioning

confidence: 93%

“…It turns out, as in our earlier works [ 29 , 30 , 31 , 32 ], that the variable-temperature spectroscopic ellipsometry (VTSE) non-destructive optical technique is very sensitive to thermal transitions and is very complementary to differential scanning calorimetry (DSC) with regard to the examination of organic layers. Literature data show that the identification of the characteristic temperatures of thermal transitions can be made on the basis of raw ellipsometric data [ 33 , 34 , 35 , 36 , 37 , 38 , 39 , 40 , 41 ] and additionally confirmed by an appropriate analysis of layer thickness changes caused by temperature change or various physical parameters [ 42 , 43 , 44 , 45 , 46 , 47 , 48 , 49 , 50 ].…”

Section: Introductionmentioning

confidence: 90%

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An Investigation of the Thermal Transitions and Physical Properties of Semiconducting PDPP4T:PDBPyBT Blend Films

et al. 2022

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This work focuses on the study of thermal and physical properties of thin polymer films based on mixtures of semiconductor polymers. The materials selected for research were poly [2,5-bis(2-octyldodecyl)-pyrrolo [3,4-c]pyrrole-1,4(2H,5H)-dione-3,6-diyl)-alt-(2,2′;5′,2″;5″,2′′′-quater-thiophen-5,5′′′-diyl)]—PDPP4T, a p-type semiconducting polymer, and poly(2,5-bis(2-octyldodecyl)-3,6-di(pyridin-2-yl)-pyrrolo [3,4-c]pyrrole-1,4(2H,5H)-dione-alt-2,2′-bithiophene)—PDBPyBT, a high-mobility n-type polymer. The article describes the influence of the mutual participation of materials on the structure, physical properties and thermal transitions of PDPP4T:PDBPyBT blends. Here, for the first time, we demonstrate the phase diagram for PDPP4T:PDBPyBT blend films, constructed on the basis of variable-temperature spectroscopic ellipsometry and differential scanning calorimetry. Both techniques are complementary to each other, and the obtained results overlap to a large extent. Our research shows that these polymers can be mixed in various proportions to form single-phase mixtures with several thermal transitions, three of which with the lowest characteristic temperatures can be identified as glass transitions. In addition, the RMS roughness value of the PDPP4T:PDBPyBT blended films was lower than that of the pure materials.

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Section: Resultsmentioning

confidence: 93%

Section: Introductionmentioning

confidence: 90%

An Investigation of the Thermal Transitions and Physical Properties of Semiconducting PDPP4T:PDBPyBT Blend Films

et al. 2022

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“…The second mode allows us to measure Ψ and Δ under thermal annealing, in heating or cooling cycles alternatively. Usually, this mode is used for thermal transition investigations, in low vacuum conditions, as in our earlier works [ 35 , 36 , 37 , 38 ]. In this study, due to the need to monitor the surface changes, with a built-in optical microscope, all measurements were made in atmospheric air conditions.…”

Section: Resultsmentioning

confidence: 99%

“…In our earlier works, VTSE was used in correlation with differential scanning calorimetry (DSC) [ 35 , 36 , 37 ] and temperature resistance measurements [ 38 ], as alternative, confirmative methods. In the work of Mei and Chung, it was shown that electrical resistance can be useful in studying the thermal properties and thermal history of carbon-fiber-reinforced nylon-6 composites [ 39 ].…”

Section: Introductionmentioning

confidence: 99%

Variable Temperature Spectroscopic Ellipsometry as a Tool for Insight into the Optical Order in the P3HT:PC70BM and PC70BM Layers

Hajduk,

Jarka,

Bednarski

et al. 2023

Polymers

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Two combined ellipsometric techniques—variable angle spectroscopic ellipsometry (VASE) and variable temperature ellipsometry spectroscopy (VTSE)—were used as tools to study the surface order and dielectric properties of thin films of a poly(3-hexylthiophene-2,5-diyl) (P3HT) mixture with a fullerene derivative (6,6-phenyl-C71-butyric acid methyl ester) (PC70BM). Under the influence of annealing, a layer of the ordered PC70BM phase was formed on the surface of the blend films. The dielectric function of the ordered PC70BM was determined for the first time and used in the ellipsometric modeling of the physical properties of the P3HT:PC70BM blend films, such as their dielectric function and thickness. The applied ellipsometric optical model of the polymer–fullerene blend treats the components of the blend as a mixture of optically ordered and disordered phases, using the effective medium approximation for this purpose. The results obtained using the constructed model showed that a layer of the ordered PC70BM phase was formed on the surface of the layer of the polymer and fullerene mixture. Namely, as a result of thermal annealing, the thickness of the layer of the ordered fullerene phase increased, while the thickness of the underlying material layer decreased.

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“…Polymer/inorganic oxide composites often exhibit different material properties compared to pure polymers. They often differ from pure polymers in their optical, thermal and electrical properties [11]. The present work aims to fabricate of PVA/PEG/In2O3 nanostructure from PVA/PEG as matrix and In2O3 nanoparticles as additive and studying the A.C electrical properties with different frequencies and In2O3 nanoparticles contents to use in various electronics nanodevices.…”

Section: Introductionmentioning

confidence: 99%

Analysis of Dielectric Properties of PVA/PEG/In2O3 Nanostructures for Electronics Devices

Hayder¹,

Hashim²,

Habeeb³

et al. 2022

RCMA

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The dielectric characteristics of PVA/PEG/In2O3 nanostructures were tested to use in various electric nanodevices. The films of nanostructures of PVA/PEG/In2O3 were synthesized by casting solution technique. The dielectric characters of PVA/PEG/In2O3 nanostructures were determined. Results expressed that the dielectric parameters of PVA/PEG were rise with rise in the In2O3 NPs ratio. The performance of ε', ε" and σAC with frequency illustrated that the ε' and ε" reduced whereas the σAC rises with rise in frequency. The final results demonstrated the PVA/PEG/In2O3 nanostructures may be suitable in various electrical nanodevices.

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Thermal and optical properties of PMMA films reinforced with Nb2O5 nanoparticles

Cited by 22 publications

References 55 publications

An Investigation of the Thermal Transitions and Physical Properties of Semiconducting PDPP4T:PDBPyBT Blend Films

An Investigation of the Thermal Transitions and Physical Properties of Semiconducting PDPP4T:PDBPyBT Blend Films

Variable Temperature Spectroscopic Ellipsometry as a Tool for Insight into the Optical Order in the P3HT:PC70BM and PC70BM Layers

Analysis of Dielectric Properties of PVA/PEG/In2O3 Nanostructures for Electronics Devices

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