2011
DOI: 10.1063/1.3582090
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Thermal annealing effects on photoluminescence properties of carbon-doped silicon-rich oxide thin films implanted with erbium

Abstract: Articles you may be interested inExcitation mechanism and thermal emission quenching of Tb ions in silicon rich silicon oxide thin films grown by plasma-enhanced chemical vapour deposition-Do we need silicon nanoclusters?Resonant structures based on amorphous silicon suboxide doped with Er 3 + with silicon nanoclusters for an efficient emission at 1550 nm Effect of ion-irradiation induced defects on the nanocluster Si ∕ Er 3 + coupling in Er-doped silicon-rich silicon oxide Appl. Phys. Lett. 91, 021909 (2007);

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Cited by 7 publications
(6 citation statements)
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“…The doses of erbium ions were varied between 1 × 10 13 –1 × 10 14 cm 2 , a typical range for characterizing emission behavior of ions minimizing inter-ionic interaction [ 47 ]. After the ion implantation, the samples were wet-etched in BHF for five minutes to remove the encapsulation oxide, sacrificial oxide, and HSQ ribbon array, and annealed at 900 °C for one hour in ultra-high purity Ar to optically activate the Er ions (Er 3+ ) based on our group’s previous study [ 48 ].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The doses of erbium ions were varied between 1 × 10 13 –1 × 10 14 cm 2 , a typical range for characterizing emission behavior of ions minimizing inter-ionic interaction [ 47 ]. After the ion implantation, the samples were wet-etched in BHF for five minutes to remove the encapsulation oxide, sacrificial oxide, and HSQ ribbon array, and annealed at 900 °C for one hour in ultra-high purity Ar to optically activate the Er ions (Er 3+ ) based on our group’s previous study [ 48 ].…”
Section: Resultsmentioning
confidence: 99%
“…As shown in Figure 8 , we observed a strong Er-induced PL emission around 1540 nm, which is the telecommunication C-band wavelength used in optical fibers, from Er-doped SiC:O NW, with no detectable Er 3+ PL from the region outside the NWs (white circled points). Er-induced PL spectra ~1540 nm corresponds to the intra-4f transition ( 4 I 13/2 → 4 I 15/2 ) of Er 3+ ions, which are effectively shielded by the outer 5s and 5p electrons, resulting photostable spectra independent of annealing temperature or ambient [ 47 , 48 ]. Furthermore, an appreciable enhancement of the Er-induced PL was observed in the NW array structure compared to its thin-film counterpart.…”
Section: Resultsmentioning
confidence: 99%
“…The peak close to 380 nm was attributed to ZnO crystals, thereby confirming that the SONWs contain a ZnO phase. In contrast, the PL peak close to 530 nm was attributed to the presence of nonbridging oxygen hole centers (NBOHCs), which are commonly observed in the silicon‐rich oxide (SiO x : 0 < x < 2) phase or/and ZnO‐related defects . These results clearly demonstrate that the presented SONWs consist of a well‐defined two‐color (blue and green) hybridized luminescent material.…”
Section: Resultsmentioning
confidence: 82%
“…19 More recent investigations suggest that defects in C-doped oxide phases are likely sensitizers for responsible for energy transfer in such structures. 20 In the white areas, the characteristic spikes in the intensity at 488 and 514 nm are a consequence of direct excitation into the 4 F 7/2 and 2 H 5/2 ligand field states (followed by nonradiative decay to the 4 I 13/2 and accompanying 1540 nm emission). Increasing the annealing temperature to 600 °C results in a uniform whitish appearance and direct Er 3+ excitation throughout the sample (data not shown).…”
Section: ■ Experimental Methodsmentioning
confidence: 99%