2009 14th OptoElectronics and Communications Conference 2009
DOI: 10.1109/oecc.2009.5213782
|View full text |Cite
|
Sign up to set email alerts
|

Thermal characterization of organic light emitting devices

Abstract: CCD-based thermoreflectance is applied on organinc light emitting devices to investigate the temperaure distribution along the device surface under different bias conditions. This technique can provide useful information on understanding the device degradation mechanism.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 8 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?