“…1,2 The demand for new interconnect materials and associated processes is increasing as device features are scaled down. 11,12 Cu͑TMVS͒͑hfac͒ 13 ͑where TMVS is trimethylvinylsilane and hfac is 1,1,1,5,5,5-hexafluoroacetylacetonate͒ is the most widely used Cu͑I͒ precursor. 3-8 The cost savings and IC performance increases due to Cu introduction will be more fully realized if deep subquarter micron, high aspect ratio, features can be filled inexpensively with barrier material and copper.…”