2016
DOI: 10.1016/j.cej.2016.03.068
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Thermal conductivity enhancement of polyethylene glycol/expanded vermiculite shape-stabilized composite phase change materials with silver nanowire for thermal energy storage

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Cited by 306 publications
(111 citation statements)
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“…Fig. A comparison of the thermal properties between the previously reported CPCMs and those obtained in this study (Table 3) shows that the phase change latent heat of the latter was lower than the former 12,32,34 , and the thermal conductivity of the latter was also lower than the former 18 . The phase change parameters obtained from the DSC evaluation are shown in Table 2, including the onset melting temperature (T M ), latent heat during the heating (H M ), onset freezing temperature (T S ), and latent heat during the cooling (H S ).…”
Section: Phase Change Behavior Of Fs-cpcmssupporting
confidence: 62%
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“…Fig. A comparison of the thermal properties between the previously reported CPCMs and those obtained in this study (Table 3) shows that the phase change latent heat of the latter was lower than the former 12,32,34 , and the thermal conductivity of the latter was also lower than the former 18 . The phase change parameters obtained from the DSC evaluation are shown in Table 2, including the onset melting temperature (T M ), latent heat during the heating (H M ), onset freezing temperature (T S ), and latent heat during the cooling (H S ).…”
Section: Phase Change Behavior Of Fs-cpcmssupporting
confidence: 62%
“…10a shows the melting and solidifying DSC curves of PEG and the FS-CPCMs. However, the prepared CPCMs had a [18] used Ag nanowires to increase the thermal conductivity of CPCMs. A comparison of the thermal properties between the previously reported CPCMs and those obtained in this study (Table 3) shows that the phase change latent heat of the latter was lower than the former 12,32,34 , and the thermal conductivity of the latter was also lower than the former 18 .…”
Section: Phase Change Behavior Of Fs-cpcmsmentioning
confidence: 99%
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“…The XRD pattern shows that five intensive diffraction peaks at 2θ of 8.9°, 17.9°, 26.6°, 35.8° and 45.1° were indexed to (001), (002), (003), (113) and (006) diffraction planes, which is characteristic of phlogopite (JCPDS 10-0495) relating to the characteristics of interlayer distance of 9.9, 5.0, 3.3, 2.5 and 2.0 Å, respectively. This result was similar to Deng et al ., in which two strong diffraction peaks at 2θ = 8.7° and 27.5° were observed for expanded vermiculite31. Another low-intense diffraction peak is found nearly at 6.1° and assigned as (001) diffraction plane of vermiculite (JCPDS 74-1732) with the basal spacing of 14.4 Å, similar with natural vermiculite characterized by Yu et al 32…”
Section: Resultssupporting
confidence: 76%