We studied the structure of thin films of various thicknesses made of benzotrifuroxan, triaminotrinitrobenzene, diaminodinitroethylene, obtained by crystallization from the gas phase on various substrates: polyethylene terephthalate, parchment, aluminum, quartz glass, polymer resin, silicon and sapphire. Preliminary preparation of gaseous products, which were obtained by the method of thermal vacuum sublimation, was carried out. It has been established that the molecular structure of the obtained thin films corresponds to the studied substances. The texture of the films has been determined. In the bulk, their morphology is determined by particles having a columnar shape, nonequilibrium faceting, and a developed surface. The measurements were carried out by X-ray powder diffraction, Raman spectroscopy, IR spectroscopy, spectrophotometry in the visible, ultraviolet, and near infrared regions, optical and electron microscopy. The surface topology and electronic properties of the obtained textured films were studied.