“…It is found that doping significantly reduces trap defects and promotes charge separation, which leads to improved PCE of PSCs. Aluminum (Al), boron (B), indium (In), and gallium (Ga) are among the most commonly used dopants for ZnO. ,,,, For instance, Mahmood et al demonstrated a PSC with a PCE of 17.18% using In-doped ZnO ETL, and Tseng et al improved PSC’s PCE to 17.6% using Al-doped ZnO ETL. , However, Al can oxidize and form aluminum oxide or alumina (Al 2 O 3 ), which can create grain boundaries and defects that limit the PCE of PSCs . On the other hand, dopants such as gallium, magnesium, lithium, and cobalt have been used, but no significant improvement in the PCE of the PSCs has been achieved. − Thus, tungsten (W) is a promising candidate for the development of doped ZnO ETLs, which shows excellent promise for the realization of efficient PSCs due to its low reactivity and similar ionic radius as Zn 2+ (0.074 nm) and W 6+ (0.064 nm). , These properties of ZnO:W eliminate the lattice distortion of the wurtzite structure ZnO.…”