2014
DOI: 10.1108/cw-10-2013-0040
|View full text |Cite
|
Sign up to set email alerts
|

Thermal effects in embedded thin- and thick-film resistors in comparison to chip resistors

Abstract: Purpose -The purpose of this paper is to investigate the thermal behaviour of thin-and thick-film resistor with different dimensions and contacts embedded into printed circuit board (PCB) and compare them to the similar constructions of discrete chip resistors assembled to standard PCBs. Design/methodology/approach -In investigations the thin-and thick-film embedded resistors with the bar form in different dimensions and configurations of contacts as well as rectangular chip resistors in package 0603 and 0402 … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2015
2015
2016
2016

Publication Types

Select...
2

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 4 publications
0
2
0
Order By: Relevance
“…Among them, X-ray inspection, scanning acoustic microscopy (SAM), plasma or acid etching, laser ablation or thermo-mechanical milling can be mentioned (Ardebili and Pecht, 2009; Liu et al , 2012; Shannon et al , 2010; Sylvester et al , 2013; Tang et al , 2011; Ng et al , 2012). Conventional X-ray as a common non-destructive method used in electronic industry (Sylvester et al , 2013; Sitek et al , 2015; Shannon et al , 2010; Stęplewski et al , 2014; Neubauer, 1997) can be useful to reveal, e.g. component misalignments, solder joint bridges or large cracks and voids in solder joints, but it becomes unsuitable when multi-layer samples with smaller feature size are examined.…”
Section: Introductionmentioning
confidence: 99%
“…Among them, X-ray inspection, scanning acoustic microscopy (SAM), plasma or acid etching, laser ablation or thermo-mechanical milling can be mentioned (Ardebili and Pecht, 2009; Liu et al , 2012; Shannon et al , 2010; Sylvester et al , 2013; Tang et al , 2011; Ng et al , 2012). Conventional X-ray as a common non-destructive method used in electronic industry (Sylvester et al , 2013; Sitek et al , 2015; Shannon et al , 2010; Stęplewski et al , 2014; Neubauer, 1997) can be useful to reveal, e.g. component misalignments, solder joint bridges or large cracks and voids in solder joints, but it becomes unsuitable when multi-layer samples with smaller feature size are examined.…”
Section: Introductionmentioning
confidence: 99%
“…A frequent, and serious, current problem is removing large amounts of heat from the units or the large size substrates utilized for assembly. In classic printed circuit board (PCB) technology based on epoxy glass laminate FR-4, heat dissipation of surface mount device (SMD) components to a heat sink, located on the other side of the substrate, is realized by thermal vias between the component and the heat sink (Stęplewski et al, 2014). Unfortunately, an excessive increase in the number of thermal vias reduces the mechanical strength of the material as well as reducing the surface heat dissipation.…”
Section: Introductionmentioning
confidence: 99%