“…Among them, X-ray inspection, scanning acoustic microscopy (SAM), plasma or acid etching, laser ablation or thermo-mechanical milling can be mentioned (Ardebili and Pecht, 2009; Liu et al , 2012; Shannon et al , 2010; Sylvester et al , 2013; Tang et al , 2011; Ng et al , 2012). Conventional X-ray as a common non-destructive method used in electronic industry (Sylvester et al , 2013; Sitek et al , 2015; Shannon et al , 2010; Stęplewski et al , 2014; Neubauer, 1997) can be useful to reveal, e.g. component misalignments, solder joint bridges or large cracks and voids in solder joints, but it becomes unsuitable when multi-layer samples with smaller feature size are examined.…”