Thermal-electromagnetic susceptibility behaviors of PWM patterns used in control electronic circuit

Diénot, Jean-Marc; Batista, Emmanuel; Ramos, Ioav

doi:10.1109/emccompo.2015.7358355

Cited by 4 publications

(3 citation statements)

References 8 publications

(11 reference statements)

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“…The mechanism by which electromagnetic interference and thermal stress affect semiconductor devices was explained in their paper. Dienot et al [28] tested the PWM generation circuit and verified the effect of the combined stress of electromagnetism and heat on the function of the circuit. Wang et al [29] proposed an efficient finite-difference time-domain (FDTD) algorithm for studying the frequency-and temperature-dependent characteristics of some graphene-based structures, with the auxiliary differential equation FDTD method and its conformal modification technique integrated together for handling atomically thin and electrically dispersive periodic geometries.…”

Section: The Effect Of Temperature On Emimentioning

confidence: 99%

Advances in Modeling and Suppression Methods of EMI in Power Electronic Converters of Third-Generation Semiconductor Devices

Gao

Wang

et al. 2023

Electronics

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With the development of high-frequency, miniaturized, and lightweight power electronic devices, third-generation semiconductor devices are more and more used in the main circuits of power electronic converters. The electromagnetic interference (EMI) generated by their fast switching can affect the performance of power electronic converters. Therefore, it is necessary to investigate the modeling and suppression methods of conducted noise in power electronic converters of third-generation semiconductor devices. This paper describes the EMI sources and coupling paths of EMI in third-generation semiconductor devices used in power electronic converters. The modeling methods of EMI are summarized from the perspectives of power devices and coupling paths. The suppression methods of conducted noise are summarized by suppressing EMI sources and improving coupling path characteristics. This paper provides a reference for the electromagnetic compatibility design of power electronic converters for third-generation semiconductor devices.

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Section: The Effect Of Temperature On Emimentioning

confidence: 99%

Advances in Modeling and Suppression Methods of EMI in Power Electronic Converters of Third-Generation Semiconductor Devices

Gao

Wang

et al. 2023

Electronics

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show abstract

“…Generally, such subsystems are based on widely-used proportionalintegral-derivative (PID) algorithms. These control algorithms are used for balancing [1], motion [2] and control [3] of robotic systems, as well as for maintenance of their normal functioning in adverse climatic conditions [4]. Temperature controllers based on such algorithms have some specifics, if they are made for research use.…”

Section: Introductionmentioning

confidence: 99%

“…However, such chambers cannot be used for tests of precision electronics that is sensitive to external electromagnetic environment, as controlled elements inside of the chamber emit interference, thus, research or tests of precision electronics can be incorrect due to electromagnetic interference. We have developed an environmental shielded TEM chamber [10] without this weakness, thus, research and tests on joint climatic and electromagnetic impact in the sphere of radio engineering can be carried out in this chamber [11], and this is important nowadays [12], moreover, biomedical research can also be carried out in this chamber [13]. Test container, a TEM cell, is the main part of an environmental shielded chamber where an object under study is exposed to electromagnetic interference and climatic effects.…”

Section: Introductionmentioning

confidence: 99%