Cu nanowires with different preferred orientations were successfully fabricated in porous anodic alumina membrane (PAAM) templates by an electrochemical method. Thermal expansion of as-prepared and annealed samples embedded in PAAM templates was studied by in situ X-ray diffraction (XRD) measurement in the temperature range from 25 to 800 °C. For the as-prepared samples, the coefficients of thermal expansion (CTEs) of the ( 111), ( 200), and (220) planes are (7.85 ( 0.10) × 10 -6 /°C, (2.91 ( 0.08) × 10 -6 /°C, and (3.40 ( 0.05) × 10 -6 /°C, respectively. The CTEs of annealed samples are (5.88 ( 0.10) × 10 -6 /°C, (5.76 ( 0.08) × 10 -6 /°C, and (5.71 ( 0.05) × 10 -6 /°C, corresponding to the (111), ( 200), and ( 220) planes, respectively. The changes of vacancy configurations in XRD heating measurement are responsible for the orientationdependent thermal expansion of as-prepared and annealed samples.