1965
DOI: 10.1002/app.1965.070090203
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Thermal expansion coefficient of polytetrafluoroethylene in the vicinity of its glass transition at about 400°K

Abstract: synopsisThe linear thermal expansion of molded PTFE samples of various crystallinities was measured in the vicinity of the transition at about 400'K. In the plot of length of the specimen versus temperature, an inflection of the straight line was observed in the temperature range from 388 to 402"K., the mean value being 396OK. (123OC.) The change of the coefficient of linear thermal expansion at thie temperature represents a typical feature of the second-order transition or the glass transition, designated as … Show more

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Cited by 38 publications
(12 citation statements)
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“…In the temperature dependence of cetl the shoulder does not disappear in agreement with our structure. At the highest draw ratios, shrinkage is influencing thermal expansion above about 300 K. The increases in volume caused by the phase transitions vary from 0.65 % for ~, -1 to 0.35 % for ,t = 4, which are in good agreement with crystallographic data from Araki [6], if the degree of crystallinity is taken into account.…”
Section: Thermal Expansionsupporting
confidence: 67%
“…In the temperature dependence of cetl the shoulder does not disappear in agreement with our structure. At the highest draw ratios, shrinkage is influencing thermal expansion above about 300 K. The increases in volume caused by the phase transitions vary from 0.65 % for ~, -1 to 0.35 % for ,t = 4, which are in good agreement with crystallographic data from Araki [6], if the degree of crystallinity is taken into account.…”
Section: Thermal Expansionsupporting
confidence: 67%
“…First, looking at the two lower traces in Figure 10(b) at no deformation condition, the modes of the underlying FEP substrate in the ZnO film exhibit a meaningful redshift frequency up to ∼4 cm −1 relative to those of the bare FEP, thus implying that in the ZnO film its underlying FEP substrate is under tensile stress. The existence of tensile stress may stem from the very large difference in thermal expansion coefficients between the ZnO at 4.75 × 10 −6 /K and that of the transparent substrate, on the order of 10 −4 /K [41][42][43]. During the oxidation stage, at a temperature of ∼275 • C, the FEP substrate was observed to be somewhat malleable.…”
Section: Journal Of Nanomaterialsmentioning
confidence: 99%
“…where M O is the molecular weight of the segment and R is the gas constant; R has the numerical value 83.1 when P* is expressed in bars, T* in OK, and V* in cm3/g. Equation (6) becomes (P*V*/T*) = R/3 = 27.7 when 3c/s = 1 is used; MO then appears as the molecular weight of a segment having exactly one external degree of freedom. The reducing parameters for PTFE melt were determined as follows: A numerical solution of eqs.…”
Section: Resultsmentioning
confidence: 99%