Abstract:Dynamic thermal management (DTM) is applied to address the thermal problem of high performance very-large-scale integrated chips. The false alarm rate (FAR) can be used to evaluate the impact of full-chip thermal field reconstruction accuracy on DTM. A low FAR relies on the accurate reconstruction of the full thermal field, especially near the temperature triggering threshold of DTM. However, little attention is currently being paid to such temperature ranges. To reduce FAR, a new full-chip thermal field recon… Show more
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