Fourteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.98CH36195)
DOI: 10.1109/stherm.1998.660395
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Thermal management of high-power electronics modules packaged with interconnected parallel plates

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Cited by 9 publications
(9 citation statements)
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“…Changes of convection coupling will be induced when the thermal environment is changed in the converters. Due to these factors, thermal convection cannot be ignored [18], and the thermal models should incorporate the convection thermal coupling resistances (R cvcp ) among the heating components. These thermal models in the literature ignore the effect of convection coupling [19].…”
Section: Thermal Models In a Boost Converter Systemmentioning
confidence: 99%
“…Changes of convection coupling will be induced when the thermal environment is changed in the converters. Due to these factors, thermal convection cannot be ignored [18], and the thermal models should incorporate the convection thermal coupling resistances (R cvcp ) among the heating components. These thermal models in the literature ignore the effect of convection coupling [19].…”
Section: Thermal Models In a Boost Converter Systemmentioning
confidence: 99%
“…These failures usually occur at the heel of the wire bond -where the most stress occurs [145,146]. The thermal resistance of the wire bonds also increase at high currents and temperatures [61,147].…”
Section: Interconnectsmentioning
confidence: 99%
“…Also, large electromagnetic fields are generated as currents pass through adjacent wires, thus creating uneven current distributions among the wires. Another disadvantage of wire-bonds is that all cooling must occur through the bottom of the die, which greatly restricts heat dissipation from the module [84]. This, combined with the localization of current flowing into the top of the device, creates hot spots on the top surface of the die at each wirebond.…”
Section: Figure 13mentioning
confidence: 99%
“…This is due both to wire flexure fatigue resulting from the wide ambient temperature swings in automotive environments and to wire liftoff resulting from the creation of these hot spots and high thermal gradients at the wirebondto-die interface at the top of the device. Additionally, the large solder area of the bond can fatigue and delaminate under thermal cycling [84] resulting in poor heat transfer over large areas of the attach under the die. This increases the temperature of the hot spots above these areas, accelerating wire liftoff failure.…”
Section: Figure 13mentioning
confidence: 99%