2021
DOI: 10.1109/mim.2021.9400958
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Thermal Noise Measurement and Characterization for Modern Semiconductor Devices

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Cited by 8 publications
(1 citation statement)
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“…An obvious benefit is that the intrinsic noise in devices waives the necessity to design complex circuitry specialized for Gaussian noise generation using Zener diodes or other devices [28]. Various types of noise exist in semiconductor devices, such as thermal noise [29], random telegraph noise [30], 1/f noise [31], etc [32,33], but a comprehensive study on the overfitting suppression effect of noise, at least for one or two types of noise, is still missing.…”
Section: Introductionmentioning
confidence: 99%
“…An obvious benefit is that the intrinsic noise in devices waives the necessity to design complex circuitry specialized for Gaussian noise generation using Zener diodes or other devices [28]. Various types of noise exist in semiconductor devices, such as thermal noise [29], random telegraph noise [30], 1/f noise [31], etc [32,33], but a comprehensive study on the overfitting suppression effect of noise, at least for one or two types of noise, is still missing.…”
Section: Introductionmentioning
confidence: 99%