We demonstrate emission
of electromagnetic pulses with frequencies
in the terahertz (THz) range from ruthenium thin films through a second-order
nonlinear optical process. Ruthenium deposited on different substrates
showed different THz emission properties. We provide evidence that
for Ru on glass above a certain power threshold, laser-induced oxidation
occurs, resulting in an increased slope of the linear dependence of
the THz electric field amplitude on pump power. The THz electric field
is mainly polarized parallel to the sample surface, pointing in the
same direction everywhere. In contrast to Ru on glass, the electric
field amplitude of the THz pulses emitted by Ru on sapphire and on
CaF2 shows a simple single linear dependence on pump power,
and it is polarized orthogonal to the sample surface. In this case,
thermal oxidation in an oven enhances the emission and introduces
an additional polarization component along the sample surface. This
component also points in the same direction everywhere on the surface,
similar to the as-deposited Ru on glass. Although the precise THz
generation mechanism remains an open question, our results show a
strong correlation between the emission strength and the degree of
oxidation. Furthermore, the results highlight the importance of the
interfaces, i.e., both the choice of the substrate and the chemical
composition of the top surface in THz emission experiments. Knowledge
of the state of the sample surface is therefore crucial for the interpretation
of THz emission experiments from (nonmagnetic) metal surfaces.