2022 IEEE Design Methodologies Conference (DMC) 2022
DOI: 10.1109/dmc55175.2022.9906468
|View full text |Cite
|
Sign up to set email alerts
|

Thermal Runaway Mitigation through Electrothermal Constraints Mapping for MCPM Layout Optimization

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2023
2023
2023
2023

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(2 citation statements)
references
References 13 publications
0
2
0
Order By: Relevance
“…Concerning multi-objective optimisation procedures for the mechanical design, the focus has mainly been on optimising the geometry of single components as magnetics [10], or capacitors [8], or of the cooling system for dissipating losses [12]. More recent studies propose also mechanical design optimisation of the switching module [13,14] and its control scheme [15], or the unified switching cell (SC) block (i.e. power semiconductor devices, gate drivers, decoupling capacitors, and cooling system) as an individual building block [16].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Concerning multi-objective optimisation procedures for the mechanical design, the focus has mainly been on optimising the geometry of single components as magnetics [10], or capacitors [8], or of the cooling system for dissipating losses [12]. More recent studies propose also mechanical design optimisation of the switching module [13,14] and its control scheme [15], or the unified switching cell (SC) block (i.e. power semiconductor devices, gate drivers, decoupling capacitors, and cooling system) as an individual building block [16].…”
Section: Introductionmentioning
confidence: 99%
“…In [13,14] a multi-objective optimisation tool for the rapid design of power semiconductor modules is presented for optimising the module's layout in terms of performance and power density. This tool includes models of the electrical parasitics and the thermal coupling between the devices.…”
Section: Introductionmentioning
confidence: 99%