2017
DOI: 10.3788/aos201737.0614003
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Thermal Stress Damage of Thin-Film Components Induced by Surface Impurities

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“…The test sample uses a space triple-junction GaAs solar cells [10][11] , and the specification is 30mm*40mm monolithic cell. The structure is mainly composed of anti-irradiation glass cover, metal grid wire, top battery, middle battery, bottom battery, substrate, and other parts.…”
Section: Test Samplementioning
confidence: 99%
“…The test sample uses a space triple-junction GaAs solar cells [10][11] , and the specification is 30mm*40mm monolithic cell. The structure is mainly composed of anti-irradiation glass cover, metal grid wire, top battery, middle battery, bottom battery, substrate, and other parts.…”
Section: Test Samplementioning
confidence: 99%