2015
DOI: 10.1016/j.mejo.2014.11.001
|View full text |Cite
|
Sign up to set email alerts
|

Thermal transient characterization of semiconductor devices with multiple heat sources—Fundamentals for a new thermal standard

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
23
0

Year Published

2016
2016
2022
2022

Publication Types

Select...
5
3

Relationship

0
8

Authors

Journals

citations
Cited by 49 publications
(25 citation statements)
references
References 5 publications
0
23
0
Order By: Relevance
“…In cooperation with Infineon we investigated how multi-heat source systems can be best described by the so called thermal resistance (impedance) characterization matrices and how elements of such a matrix can be identified by thermal transient measurements [36]. Another topic our team was engaged with was the further development of a measurement card using an array of miniature IR sensing devices which is aimed at IR mapping of boards of live system [37].…”
Section: Further Results Related To Thermal Characterizationmentioning
confidence: 99%
“…In cooperation with Infineon we investigated how multi-heat source systems can be best described by the so called thermal resistance (impedance) characterization matrices and how elements of such a matrix can be identified by thermal transient measurements [36]. Another topic our team was engaged with was the further development of a measurement card using an array of miniature IR sensing devices which is aimed at IR mapping of boards of live system [37].…”
Section: Further Results Related To Thermal Characterizationmentioning
confidence: 99%
“…Following the terminology introduced by D. Schweitzer [9,10], let us call such nodes as driving points and/ or monitoring points. When a node is a driving point, it represents a time variant heat dissipating element.…”
Section: Sunred Algorithm With Transfer Functions Representing Thermamentioning
confidence: 99%
“…The number of driving points in a system is equal to the number of elementary heat-sources we have in the system. Since any location in the system can be a monitoring point, in a general case the number of monitoring points can be greater or equal to the number of driving points [10]. The "thermal coupling" (or heat propagation) between a driving point and a monitoring point is described by the thermal transfer impedance between these points.…”
Section: Sunred Algorithm With Transfer Functions Representing Thermamentioning
confidence: 99%
See 1 more Smart Citation
“…Existing multi-domain modeling procedures with N subsequent CFD simulations can provide a good solution for analyzing the effects of LED variations at system level, but a fast modeling method for achieving a precise T j of LED luminaires is still an urgent need. Following the concept of multi-domain modeling [35], [36] and [38], this work aims to provide a simple modeling method to predict a precise luminaire T j quickly.…”
mentioning
confidence: 99%