“…Work done in recent years has clearly demonstrated that radiation and temperature induced voltages (RIEMF and TIEMF, respectively) appear in all the cables studied so far (MI coaxial cables, ceramic and enamel coated single cables) [1][2][3][4][5][6][7][8]. TIEMF appears as generation of a voltage along the centre conductor of cables due to temperature gradients, (particularly large for MI Cu cored cables) and cable inhomogeneity.…”