Thermoactivation spectroscopy of solid Ar doped with N2

Ponomaryov, A. N.; Savchenko, E. V.; Khizhniy, I. V.; Gumenchuk, G. B.; Frankowski, Marcin; Bondybey, V. E.

doi:10.1063/1.2746245

Cited by 13 publications

(7 citation statements)

References 7 publications

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“…Correlation of atomic and molecular TSL yields in the low temperature range (5–11 K) suggests common TSL mechanism–neutralization reactions. The similar trends, predominance of neutralization reactions at low temperatures, were found in Ar films doped with nitrogen and preirradiated with an electron beam. , …”

Section: Results and Discussionsupporting

confidence: 72%

“…The similar trends, predominance of neutralization reactions at low temperatures, were found in Ar films doped with nitrogen and preirradiated with an electron beam. 44,45 Interesting question is what kind of electron traps is responsible for the neutralization. In order to clear up the question, we measured the spectrally resolved TSL yield of charge recombination emission of the intrinsic Ne centers shown in Figure 5 together with the TSEE yield.…”

Section: ■ Results and Discussionmentioning

confidence: 99%

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Radiation Effects in Solid Nitrogen and Nitrogen-Containing Matrices: Fingerprints of N₄⁺ Species

et al. 2014

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The radiation effects and relaxation processes in solid N2 and N2-doped Ne matrices, preirradiated by an electron beam, have been studied in the temperature range of 5-40 and 5-15 K, respectively. The study was performed using luminescence methods: cathodoluminescence CL and developed by our group nonstationary luminescence NsL, as well as optical and current activation spectroscopy methods: spectrally resolved thermally stimulated luminescence TSL and exoelectron emission TSEE. An appreciable accumulation of N radicals, N(+), N2(+) ions, and trapped electrons is found in nitrogen-containing Ne matrices. Neutralization reactions were shown to dominate relaxation scenario in the low-temperature range, while at higher temperatures diffusion-controlled reactions of neutral species contribute. It was conceived that in α-phase of solid N2, the dimerization reaction (N2(+) + N2 → N4(+)) proceeds: "hole self-trapping". Tetranitrogen cation N4(+) manifests itself by the dissociative recombination reaction with electron: N4(+) + e(-) → N2*(a'(1)Σ(u)(-)) + N2 → N2 + N2 + hν. In line with this assumption, we observed a growth of the a'(1)Σ(u)(-) → X(1)Σ(g)(+) transition intensity with an exposure time in CL spectra and the emergence of this emission in the course of electron detrapping on sample heating in the TSL and NsL experiments.

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Section: Results and Discussionsupporting

confidence: 72%

Section: ■ Results and Discussionmentioning

confidence: 99%

Radiation Effects in Solid Nitrogen and Nitrogen-Containing Matrices: Fingerprints of N₄⁺ Species

et al. 2014

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“…In a previous study, it was assigned to stimulation by chemiluminescent reaction, N atom recombination leading to formation of N 2 *. A detailed study of N 2 -doped Ar films shows that the “cold” vibrationally relaxed v′ = 0 A 3 Σ u + N 2 emission in TSL from samples preirradiated by an electron beam is observed up to 42 K, with a maximum near 25 K and a shoulder between 30 and 35 K. The yield of intrinsic VUV TSL closely follows N 2 * emission in line with our recent study …”

Section: Resultssupporting

confidence: 88%

Charging Effects in an Electron Bombarded Ar Matrix and the Role of Chemiluminescence-Driven Relaxation

et al. 2011

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The relaxation processes in pure and doped Ar films preirradiated by an electron beam are studied with the focus on charging effects. Correlated real time measurements have been performed applying current and optical activation spectroscopy methods. Thermally stimulated exoelectron emission and thermally stimulated luminescence are detected in the vacuum ultraviolet and visible range. An appreciable accumulation of electrons in the matrix is found, and prerequisites for negative space charge formation are ascertained. The part played by pre-existing and radiation-induced defects as well as dopants is considered and the temperature range of the electron trap stability is elucidated. It is shown that laser-induced electron detachment from O(-) centers results in an enhancement of electron detrapping via the chemiluminescence mechanism, viz. neutralized and thermally mobilized O atoms recombine. Formation of O(2)* results in the emission of visible photons. These photons act as a stimulating factor for electron release and transport, terminating in exoelectron emission and charge recombination. Chemiluminescence therefore plays an important role in the decay of charged centers.

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“…The experiments presented here were performed using facilities at TUM and ILT. The experimental techniques developed have been described in more detail in [30,33], and are therefore only briefly discussed here. Using the TSEE method in a desorption study is obviously preferable in comparison with other current activation spectroscopy methods because TSEE yield provides information on electron traps essentially on the surface and in the subsurface layers.…”

Section: Methodsmentioning

confidence: 99%

Anomalous low-temperature “post-desorption” from solid nitrogen

Savchenko

Khyzhniy

Uyutnov

et al. 2013

Low Temperature Physics

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Anomalous low-temperature post-desorption (ALTpD) from the surface of nominally pure solid nitrogen preliminary irradiated by an electron beam was detected for the first time. The study was performed using a combination of activation spectroscopy methodsthermally stimulated exoelectron emission (TSEE) and spectrally resolved thermally stimulated luminescence (TSL)with detection of the ALTpD yield. Charge recombination reactions are considered to be the stimulating factor for the desorption from pre-irradiated α-phase solid nitrogen.

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Thermoactivation spectroscopy of solid Ar doped with N2

Cited by 13 publications

References 7 publications

Radiation Effects in Solid Nitrogen and Nitrogen-Containing Matrices: Fingerprints of N₄⁺ Species

Radiation Effects in Solid Nitrogen and Nitrogen-Containing Matrices: Fingerprints of N₄⁺ Species

Charging Effects in an Electron Bombarded Ar Matrix and the Role of Chemiluminescence-Driven Relaxation

Anomalous low-temperature “post-desorption” from solid nitrogen

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Thermoactivation spectroscopy of solid Ar doped with N2

Cited by 13 publications

References 7 publications

Radiation Effects in Solid Nitrogen and Nitrogen-Containing Matrices: Fingerprints of N4+ Species

Radiation Effects in Solid Nitrogen and Nitrogen-Containing Matrices: Fingerprints of N4+ Species

Charging Effects in an Electron Bombarded Ar Matrix and the Role of Chemiluminescence-Driven Relaxation

Anomalous low-temperature “post-desorption” from solid nitrogen

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Radiation Effects in Solid Nitrogen and Nitrogen-Containing Matrices: Fingerprints of N₄⁺ Species

Radiation Effects in Solid Nitrogen and Nitrogen-Containing Matrices: Fingerprints of N₄⁺ Species