2005
DOI: 10.1134/1.1944849
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Thermodynamic Stability and Redistribution of Charges in Ternary AlGaN, InGaN, and InAlN Alloys

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Cited by 40 publications
(9 citation statements)
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“…Depending on the model and the theoretical method used, the results of the phase separation zone in the unconstrained case are quite different from one report to the other. At the growth temperature of 900 °C for InAlN, the reported immiscibility gaps were 12–88% , 14–70% , and 17–92% , which is in agreement with our results. For InGaN, at the growth temperature of 800 °C the phase separation zone determined by Karpov et al was between 10 and 80% indium composition which is also in agreement with our calculations (10–73%).…”
Section: Comparison With Other Studiessupporting
confidence: 92%
See 1 more Smart Citation
“…Depending on the model and the theoretical method used, the results of the phase separation zone in the unconstrained case are quite different from one report to the other. At the growth temperature of 900 °C for InAlN, the reported immiscibility gaps were 12–88% , 14–70% , and 17–92% , which is in agreement with our results. For InGaN, at the growth temperature of 800 °C the phase separation zone determined by Karpov et al was between 10 and 80% indium composition which is also in agreement with our calculations (10–73%).…”
Section: Comparison With Other Studiessupporting
confidence: 92%
“…The phase separation in InGaN and InAlN was investigated by various theoretical groups . Depending on the model and the theoretical method used, the results of the phase separation zone in the unconstrained case are quite different from one report to the other.…”
Section: Comparison With Other Studiesmentioning
confidence: 99%
“…The observed composition modulations are unlikely to be due to spinodal decomposition as recent theoretical calculations suggest the stability of alloys with the studied compositions, 11 and as they seem to appear only in RFMBEgrown InAlN films. 5 Zhou et al 5 relate the In composition changes to a mechanism proposed by Goldman et al 12 which attributes vertically oriented superlattice formation to random fluctuations in alloy concentration at the start of film growth.…”
mentioning
confidence: 79%
“…5 As is known, understanding the microstructural characteristics is of fundamental importance for improving the device performance. 9, 10 Sadler et al 11 showed pits on the In x Al 1−x N surfaces by atomic force microscopy. However, so far, there have been only limited knowledge of In x Al 1−x N films due to the difficulty in obtaining high-quality In x Al 1−x N layers for the large difference in thermal stability between InN and AlN.…”
Section: The Origin and Evolution Of V-defects In In X Al 1−x N Epilamentioning
confidence: 99%