A single‐crystalline samples of Zn‐substituted type‐VIII clathrate Ba8Ga16Sn30 with n‐type carriers by α‐Sn flux method according to the formula Ba8Ga16ZnxSn30 (x = 0, 0.5, 1, and 1.5) is grown. It is found that as the amount of Zn increases from 0.025 to 0.155, the content of Ga decreases from 15.18 to 14.72, indicating Zn atoms preferentially replacing Ga. The carrier concentrations of obtained samples vary from 3.55 × 1019 to 5.53 × 1019 cm−3 as carrier mobility changes from 14.7 to 20.9 cm2 · V−1 · s−1 at room temperature. Meanwhile, the endothermic peak temperature for all samples is approximately 519 °C, which is slightly lower than that of the previous experimental reported. For all samples, their effective mass m*/m0 are lower than that prepared by β‐Sn, indicating that the band structure near the conduction band minima is affected. As a result, the sample with x = 1.5 obtains the higher power factor with the maximum value of 1.07 × 10−3 W m−1 K−2 at 568 K and the largest ZT value of 0.63 at 537 K.