2018
DOI: 10.1002/pssa.201800136
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Thermoelectric Properties of Bi‐Doped Mg2Si0.6Sn0.4 Solid Solutions Synthesized by Two‐Step Low Temperature Reaction Combined with Hot Pressing

Abstract: The goal of this study is to investigate the influence of the amount of Bi doping on the microstructure and thermoelectric properties of the Mg 2 Si 0.60 Sn 0.4 material studied by X-ray diffraction, scanning electron microscopy, and thermoelectric measurements. The results of the present study provide strong evidence for the presence of a number of secondary phases with different stoichiometries, including Si-rich and Sn-rich phases, besides the main matrix and the MgO. Phase separation could be attributed to… Show more

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Cited by 15 publications
(9 citation statements)
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References 62 publications
(124 reference statements)
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“…24 The former sample exhibits higher σ than most known high-performance materials in this family, including Mg 2 Si 0.57 Sn 0.4 Bi 0.03 with 1780 Ω −1 cm −1 at 320 K, which was synthesized by a two-step solid-state reaction combined with hot-pressing, and exhibited a zT max (850 K) = 1.2. 34 As the lattice parameter continued to increase from 3 to 4.5% Bi, at least part of the additional Bi atoms is present in the crystals of the 4.5% Bi sample and should provide additional electrons. Thus, we postulate that the experimentally observed lower electrical conductivity of the 4.5% Bi sample results either from the ionized impurity scattering between carriers as found in other n-type Mg 2 Si-doped materials 35−37 and/or from the presence of small additional side products as Mg 3 Bi 2 , as found recently.…”
Section: Resultsmentioning
confidence: 99%
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“…24 The former sample exhibits higher σ than most known high-performance materials in this family, including Mg 2 Si 0.57 Sn 0.4 Bi 0.03 with 1780 Ω −1 cm −1 at 320 K, which was synthesized by a two-step solid-state reaction combined with hot-pressing, and exhibited a zT max (850 K) = 1.2. 34 As the lattice parameter continued to increase from 3 to 4.5% Bi, at least part of the additional Bi atoms is present in the crystals of the 4.5% Bi sample and should provide additional electrons. Thus, we postulate that the experimentally observed lower electrical conductivity of the 4.5% Bi sample results either from the ionized impurity scattering between carriers as found in other n-type Mg 2 Si-doped materials 35−37 and/or from the presence of small additional side products as Mg 3 Bi 2 , as found recently.…”
Section: Resultsmentioning
confidence: 99%
“…325 Sn 0.645 Bi 0.03 has the highest electrical conductivity (2490 Ω –1 cm –1 ) compared to 2140 Ω –1 cm –1 for Mg 2 Si 0.30 Sn 0.67 Bi 0.03 at 300 K. The results exhibit comparable σ to Mg 2 Si 0.3 Sn 0.665 Bi 0.035 with σ = 2400 Ω –1 cm –1 at 320 K, which was prepared via two-stage ball milling, followed by annealing using tantalum crucibles sealed by arc melting method . The former sample exhibits higher σ than most known high-performance materials in this family, including Mg 2 Si 0.57 Sn 0.4 Bi 0.03 with 1780 Ω –1 cm –1 at 320 K, which was synthesized by a two-step solid-state reaction combined with hot-pressing, and exhibited a zT max (850 K) = 1.2 …”
Section: Resultsmentioning
confidence: 99%
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“…Figure 13. The maximum thermoelectric figure of merit, zT, of selected n-type magnesium silicides: Mg2Si0.97Bi0.03 [806], Mg2Si0.5875Sn0.4Sb0.0125 [807], Mg1.995La0.005Si0.58Sn0.42 [808], Mg2.10Si0.38Sn0.6Sb0.02 [809], Mg2Si0.487Sn0.5Sb0.013 [810], Mg2(Si0.3Sn0.7)0.975Sb0.025 [811], Mg2Si0.6Ge0.4B i0.02 [812], Mg2Si0.385Sn0.6Sb0.015 [813], Mg2Si0.3925Sn0.6Sb0.0075 [814], Mg2(Si0.4Sn0.6)0.97Bi0.03 [815], Mg2Si0.57Sn0.4Bi0.03 [816], Mg2.2Si0.49Sn0.5Sb0.01 [817], (Mg2.06Si0.3Sn0.68Bi0.02 [818], Mg2Si0.35Sn0.62Bi0.03 [819], Mg2(Si0.4Sn0.6)0.82Sb0.18 [820], Mg2Si0.53Sn0.4Ge0.05Bi0.02 [821], Mg2.08Si0.364Sn0.6Sb0.036 [789], Mg2.08Si0.37Sn0.6Bi0.03 [822], Mg1.98Cr0.02(Si0.3Sn0.7)0.98Bi0.02 [788]. Material Material Material Material Material 3.12.…”
Section: Silicide Thermoelectricsmentioning
confidence: 99%