2007
DOI: 10.1002/sca.20074
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Thermomechanical Formation and Recovery of Nanoindents in a Shape Memory Polymer Studied Using a Heated Tip

Abstract: This paper investigates the thermomechanical formation and recovery of nanometer-scale indents in a shape memory polymer (SMP), studied using a heated atomic force microscope (AFM) tip and hot-stage atomic force microscopy. The material tested is a tert-butyl acrylate (tBA)-based polymer, which has a glass transition temperature of 60 degrees C. The AFM tip forms indents in the polymer in the temperature range 25-250 degrees C. The shape recovery of the indents is studied while the polymer is heated up to 100 … Show more

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Cited by 20 publications
(8 citation statements)
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“…The cross-bridges (actin and myosin) cycling in the overlap zone are not so stable in elasticity which depends on sarcomere locations, physiological conditions and sources of muscle fibers. Secondly, compression of nano-scale AFM tips onto micro-scale fibers is not an ideal linear process essentially (Yang et al, 2008; Feng et al, 2008). So, the indentation of sharp tips would affect the mechanical properties of the fibers obviously in the initial stages, and the geometry of tips would also influence the measurement of elasticity.…”
Section: Discussionmentioning
confidence: 99%
“…The cross-bridges (actin and myosin) cycling in the overlap zone are not so stable in elasticity which depends on sarcomere locations, physiological conditions and sources of muscle fibers. Secondly, compression of nano-scale AFM tips onto micro-scale fibers is not an ideal linear process essentially (Yang et al, 2008; Feng et al, 2008). So, the indentation of sharp tips would affect the mechanical properties of the fibers obviously in the initial stages, and the geometry of tips would also influence the measurement of elasticity.…”
Section: Discussionmentioning
confidence: 99%
“…Nano‐TA is an AFM based thermo‐mechanical analytical technique, recently introduced by Anasys. With the help of additional accessories this technique enables an AFM to measure a material's thermal properties in a sub‐100 nm localized area . Using the optical resolution of the AFM, a specially manufactured doped silicon probe with tip radius < 30 nm is put in contact at a desired location and heated at a rapid heating rate.…”
Section: Methodsmentioning
confidence: 99%
“…Despite these common purposes, there is a lack of consensus on the measurement and treatment methods used for the study of the imprint indentation. There are several measurement means: some studies are primarily focused on the use of optical microscopy (Yang et al ., ), scanning electron microscopy (SEM) (Dwyer‐Joyce et al ., ), or confocal microscopy (Santos et al ., ; Keryvin, ), while others are based on profile measurement (Hainsworth et al ., ), atomic force microscopy (AFM) measurements (Yang et al ., ) or interferometric microscopy (Su et al ., ; Marteau et al ., ). It is worth noting that most of the studies rely on qualitative information.…”
Section: Introductionmentioning
confidence: 99%