“…The typical resolution of the Wollaston wire based probes used in SThM is approximately 1 m, although the use of thinner wires (Pollock and Hammiche, 2001) or the addition of diamond tips (Brown et al, 2008) has achieved a resolution of around 100 nm. In nano-TA the conventional silicon based AFM tip is replaced by a specialised microfabricated silicon-based probe with a miniature heater that has a topographic spatial resolution of around 5 nm and a thermal property measurement resolution of up to 20 nm (Sedman et al, 2009). Importantly this probe enables a surface to be studied with the most widely applied AFM imaging mode, tapping mode, enabling the analysis of softer samples, such as polymers, without damage from the imaging probe.…”