Thermoreflectance technique to measure thermal effusivity distribution with high spatial resolution

Hatori, Kimihito; Taketoshi, Naoyuki; Baba, Toshihide; Ohta, Hiromichi

doi:10.1063/1.2130333

Cited by 75 publications

(57 citation statements)

References 18 publications

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“…conductivities. This discrepancy between the values in the literature for regions with higher thermal conductivity is considered to be caused by the effect of a two -dimensional heat flow, which is not considered in the conventional one-dimensional model [12]. This assump -tion was also confirmed experimentally.…”

Section: Introductioncontrasting

confidence: 41%

A simple calibration procedure to determine thermal effusivity values measured by using a thermal microscope

Hatori¹,

Ohta²

2008

Jpn. J. Thermophys. Prop.

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A thermal microscope is a useful tool for investigating the spatial distribution of the thermal transport properties of materials. However, for materials with relatively high thermal effusivities, it is well known that the values calculated on the basis of the conventional one-dimensional heat flow solution are higher than the values provided in the literature. In this study, we developed a simple calibration procedure for a thermal microscope to measure the thermal effusivities of materials by using several reference materials whose thermal effusivities are known. It is expected that the temperature response will be influenced by not only the thermal effusivity but also the heat capacity per unit volume. However, reference samples with different heat capacities per unit volume were used. In comparison with the calculated values obtained with the conventional one-dimensional heat flow solution, the values for pure iron obtained with our calibration procedure, without considering the heat capacity per unit volume, were closer to the values provided in the literature. We found that this procedure is useful for calibrating a thermal microscope easily for measuring thermal effusivity.

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Section: Introductioncontrasting

confidence: 41%

A simple calibration procedure to determine thermal effusivity values measured by using a thermal microscope

Hatori¹,

Ohta²

2008

Jpn. J. Thermophys. Prop.

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“…The commercial available equipment was supplied by Bethel Co., Ltd., Ibaraki, Japan, and was named thermal microscope. 15) Figure 2 illustrates a schematic diagram of the thermal microscope. Semiconductor laser was used as a heating laser.…”

Section: Thermal Microscopementioning

confidence: 99%

Thermal conductivity measurement at the micrometer scale of ceramics using thermoreflectance technique -High-thermal-conductivity AlN with reduced amount of grain boundary phase-

Lee

Yamada

Kume

et al. 2008

J. Ceram. Soc. Japan

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High-thermal-conductivity AlN ceramic with eliminated grain boundary phase was prepared by long-term sintering with Y2O3 addition at 1900°C for 100 h in a reducing N2 atmosphere. The thermal conductivity of polished surfaced of obtained ceramic was quantitatively measured at the micrometer-scale by using a thermoreflectance technique with periodic heating. This equipment measures the phase lag, which is the delay between the signal of periodic heating laser and the reflectance signal of detecting laser, to calculate thermal effusivity using the calibration curve obtained from standard materials. The conductivity of polished surface of the ceramic is calculated from obtained thermal effusivity, density and specific heat. The thermal conductivities on the densified and polished surface of the ceramic were ranged from 219 to 318 W/m·°C. Low-thermalconductivity region (< 20 W/m·°C) relating to presence of hidden pores was observed in thermal conductivity map of the polished surface. Furthermore, high-resolution map of thermal conductivity demonstrated no significant reduction in thermal conductivities due to presence of grain boundaries.

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“…Photothermal techniques include photothermal displacement, 7 photothermal beam deflection (or "mirage"), 8 photothermal radiometry (PTR), 9 and photothermal reflectance (or thermoreflectance). [10][11][12][13] Thermoreflectance techniques may be distinguished as one of the two measurement types: time-domain and frequencydomain measurements. In the frequency-domain thermoreflectance technique, a layered sample (an n-layer model is presented but the results are later presented for a single layer on a substrate) is heated by the absorption of a modulated (sinusoidal) heat source supplied by a pump laser.…”

Section: Introductionmentioning

confidence: 99%

“…With a computer-controlled, motorized stage, local thermal effusivity maps of a sample surface can be obtained. 11 To remove the complexity of lens alignments, fiber-aligned thermoreflectance is also under study. 14 Precise modeling of the heat transport process in the layered-sample system is significant because the reflected signal only has an implicit relationship with the thermal properties of the system.…”

Section: Introductionmentioning

confidence: 99%

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Parametric study of the frequency-domain thermoreflectance technique

Xing

Jensen

Hua

et al. 2012

Journal of Applied Physics

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Thermal conductivity measurements of non-metals via combined time-and frequency-domain thermoreflectance without a metal film transducer Review of Scientific Instruments 87, 094902 (2016) Without requiring regression for parameter determination, one-dimensional (1D) analytical models are used by many research groups to extract the thermal properties in frequency-domain thermoreflectance measurements. Experimentally, this approach involves heating the sample with a pump laser and probing the temperature response with spatially coincident probe laser. Micron order lateral resolution can be obtained by tightly focusing the pump and probe lasers. However, small laser beam spot sizes necessarily bring into question the assumptions associated with 1D analytical models. In this study, we analyzed the applicability of 1D analytical models by comparing to 2D analytical and fully numerical models. Specifically, we considered a generic nlayer two-dimensional (2D), axisymmetric analytical model including effects of volumetric heat absorption, contact resistance, and anisotropic properties. In addition, a finite element numerical model was employed to consider nonlinear effects caused by temperature dependent thermal conductivity. Nonlinearity is of germane importance to frequency domain approaches because the experimental geometry is such that the probe is always sensing the maximum temperature fluctuation. To quantify the applicability of the 1D model, parametric studies were performed considering the effects of: film thickness, heating laser size, probe laser size, substrate-to-film effusivity ratio, interfacial thermal resistance between layers, volumetric heating, substrate thermal conductivity, nonlinear boundary conditions, and anisotropic and temperature dependent thermal conductivity. V C 2012 American Institute of Physics. [http://dx

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Thermoreflectance technique to measure thermal effusivity distribution with high spatial resolution

Cited by 75 publications

References 18 publications

A simple calibration procedure to determine thermal effusivity values measured by using a thermal microscope

A simple calibration procedure to determine thermal effusivity values measured by using a thermal microscope

Thermal conductivity measurement at the micrometer scale of ceramics using thermoreflectance technique -High-thermal-conductivity AlN with reduced amount of grain boundary phase-

Parametric study of the frequency-domain thermoreflectance technique

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