Thickness dependence of structural, magnetic properties and reversal mechanism of Co–Cr–Ta/Cr longitudinal recording media

kim, P.L.K. Phan le; Lodder, J.C.

doi:10.1016/s0304-8853(01)01234-3

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Cited by 5 publications

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“…8 show a large deviation from both the coherent rotation model and the domain-wall motion model. Usually, this kind of behavior is ascribed to the incoherent nucleation curling mode [18]. According to the curling mode [19,20], the peak in the curve of angle dependence of the coercivity shifts to a higher angle due to either an increase in grain size or a decrease in the magnetocrystalline anisotropy constant.…”

Section: Article In Pressmentioning

confidence: 99%

Dependence of microstructure and magnetic properties of FePt films on Cr90Ru10 underlayers

Ding

Chen

Liu

et al. 2005

Journal of Magnetism and Magnetic Materials

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Section: Article In Pressmentioning

confidence: 99%

Dependence of microstructure and magnetic properties of FePt films on Cr90Ru10 underlayers

Ding

Chen

Liu

et al. 2005

Journal of Magnetism and Magnetic Materials

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Microstructure and magnetic properties studies of SmCo5 thin films grown on MgO and glass substrates

Zhang

Chen

et al. 2009

Journal of Magnetism and Magnetic Materials

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Improvement of chemical ordering of FePt (001) oriented films by MgO buffer layer

Lim

Chen

et al. 2008

Journal of Applied Physics

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Chemically ordered L10 FePt layer was obtained at temperature as low as 280°C by in situ heating by using MgO buffer layer on CrRu (200) underlayer. The chemical ordering and magnetocrystalline anisotropy, Ku, increased with increasing deposition temperature from 280to400°C. The out-of-plane coercivity Hc⊥ also increased significantly from 2.7to9.0kOe. All the films showed perpendicular anisotropy. The reason for the increase in the coercivity was investigated by reducing the thickness of the FePt layer to 4nm and varying the thickness of the MgO buffer layer at 1, 2, and 4nm. Well isolated FePt islands were formed. When the MgO layer was 1nm, the Hc⊥ of the 4nm FePt layer was as high as 12kOe. However, it reduced to 6.3kOe when the MgO was 4nm. The change in Hc⊥ was due to the improved chemical ordering and thus higher magnetocrystalline anisotropy.

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Thickness dependence of structural, magnetic properties and reversal mechanism of Co–Cr–Ta/Cr longitudinal recording media

Cited by 5 publications

References 7 publications

Dependence of microstructure and magnetic properties of FePt films on Cr90Ru10 underlayers

Dependence of microstructure and magnetic properties of FePt films on Cr90Ru10 underlayers

Microstructure and magnetic properties studies of SmCo5 thin films grown on MgO and glass substrates

Improvement of chemical ordering of FePt (001) oriented films by MgO buffer layer

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