Thickness-dependent electronic and magnetic properties of γ′−Fe4N atomic layers on Cu(001)

Abstract

Growth, electronic and magnetic properties of γ ′ -Fe4N atomic layers on Cu(001) are studied by scanning tunneling microscopy/spectroscopy and x-ray absorption spectroscopy/magnetic circular dichroism. A continuous film of ordered trilayer γ ′ -Fe4N is obtained by Fe deposition under N2 atmosphere onto monolayer Fe2N/Cu(001), while the repetition of a bombardment with 0.5 keV N + ions during growth cycles results in imperfect bilayer γ ′ -Fe4N. The increase in the sample thickness causes the change of the surface electronic structure, as well as the enhancement in the spin magnetic moment of Fe atoms reaching ∼ 1.4 µB/atom in the trilayer sample. The observed thickness-dependent properties of the system are well interpreted by layer-resolved density of states calculated using first principles, which demonstrates the strongly layer-dependent electronic states within each surface, subsurface, and interfacial plane of the γ ′ -Fe4N atomic layers on Cu(001).

Dynamic Interface Formation in Magnetic Thin Film Heterostructures

“…Thus, we expect the dominant accumulation of electrons in the out‐of‐plane 3d orbitals of the Fe layer from the energy range between ≈−0.2 eV and the Fermi energy. This would enhance the in‐plane magnetic anisotropy as a consequence of the increase in the LDOS of the out‐of‐plane Fe 3d orbitals near the Fermi energy . Furthermore, as shown in Figure , this tendency is valid even if the thickness of the Fe layer changes due to the alloy formation (6, 7, and 8 ML).…”

Segmented Undulator for Extensive Polarization Controls in ≤1 nm-rad Emittance Rings

“…The comparison in Figure 4 demonstrates the expected performance of the soft X-ray segmented undulator in a 1-nm-rad emittance ring. It is worth mentioning that an XMCD image contrast can be obtained in nanometer scales at P C = 0.38 [29] and magnetic moments of atomically thin films are quantitatively determined by applying the sum rules of the XMCD spectra taken at P C = 0.57 [37] and P C = 0.65 [38]. The circular polarization modes of the segmented undulator in Figure 4(b) are sufficient to characterize magnetic materials.…”

Magnetic Enhancement and Nitriding Process of Fe Atomic Layers on Si (111)-7×7-CH3OH Surface

“…Finally, from the point of high density magnetic storage [28,29], it is interesting to prepare the storage unit with a critical size lower than 10 nm. The present work reveals a simple way to realize it as well as the physicochemical mechanism behind it [30,31].…”