Thickness Dependent X-Ray and Raman Studies of PrMnO3 Thin Films

Abstract

Abstract-Raman spectra of PrMnO 3 thin films deposited on lattice mismatched substrate (LaAlO 3 ) show a pronounced dependence on the film thickness and also on the degree of lattice mismatch. PrMnO 3 thin films were deposited by pulsed laser deposition on LaAlO 3 substrate, on this substrate the films experience in-plane compressive and therefore out-of-plane tensile strain. The gradual release of strain on increasing the film thickness is observed by the values of out-of-plane lattice parameters calculated by (002) reflection of films. A systematic trend in the Raman modes on increasing the thickness was also observed in the Raman spectra. All the Raman modes showed hardening on decreasing the thickness. This is attributed to the effect of strain gradually decreases on increasing the thickness of the films. Raman modes also seem to be sensitive to the lattice distortion in the thinner films.Index Terms-Jahn-teller distortion, manganite thin films, pulsed laser deposition, raman spectroscopy.

Structural, optical and electrical properties of copper oxide thin films deposited by spray pyrolysis

“…These peaks are widely reported in the literature [22][23][24]. This confirms the presence of a single CuO phase with a monoclinic structure as deduced from the diffraction analysis.Chaturvedi and Sathe [25] have studied the variation of Raman modes in CuO thin films by pulsed laser deposition as a function of thickness using Raman spectroscopy. They noted that the thickness increases leads to the increase in intensity of main Raman modes.…”