2002
DOI: 10.1063/1.1453950
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Thickness effects on magnetic properties and ferromagnetic resonance in Co–Ni–Fe–N soft magnetic thin films

Abstract: In this study, the magnetic properties and microstructures have been investigated in Co–Ni–Fe–N soft magnetic thin films with various film thicknesses (0.01–1.0 μm). As the film thickness decreases, the coercivity, electrical resistivity, and magnetic anisotropy field of these films increases from 1.1 to 7.9 Oe, 53 to 188 μΩ cm, and 20 to 70 Oe, respectively. In addition, excellent high frequency characteristics were achieved in Co–Ni–Fe–N films with thicknesses less than 0.3 μm, where an effective permeabilit… Show more

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Cited by 14 publications
(5 citation statements)
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“…The results were obtained as a result of the thickness effect and Y addition, which increased the spin exchange coupling [ 39 , 40 ]. The thickness effect states that as the thickness increases, the maximum χ ac values also increase [ 41 ]. When the thickness was 50 nm, the maximum χ ac value was 0.11 at the as-deposited state, 0.13 when the annealed temperature was 100 °C, 0.15 when the heat treatment temperature was 200 °C, and the maximum χ ac value was 0.20 when the heat treatment temperature was 300 °C.…”
Section: Resultsmentioning
confidence: 99%
“…The results were obtained as a result of the thickness effect and Y addition, which increased the spin exchange coupling [ 39 , 40 ]. The thickness effect states that as the thickness increases, the maximum χ ac values also increase [ 41 ]. When the thickness was 50 nm, the maximum χ ac value was 0.11 at the as-deposited state, 0.13 when the annealed temperature was 100 °C, 0.15 when the heat treatment temperature was 200 °C, and the maximum χ ac value was 0.20 when the heat treatment temperature was 300 °C.…”
Section: Resultsmentioning
confidence: 99%
“…In this work, Object-Oriented Micromagnetic Framework (OOMMF) simulations were performed on the filter structure shown in Figure 1a. OOMMF solves Landau-Lifshitz-Gilbert (LLG) equation using finite-difference methods [20][21][22][23].…”
Section: Methodsmentioning
confidence: 99%
“…Properties of micron thick films grown by magnetron sputtering deposition are therefore rarely reported. Sputtered films thicker than 500 nm are even rarer although a thickness transition from amorphous to polycrystalline phase [17] and strong thickness dependence of coercivity [18] have been reported and unexplained.…”
Section: Introductionmentioning
confidence: 98%