Thickness Measurement of Polyethylene Foam by Light Attenuation.

Ueda, Masahiro; Ishikawa, Kazuhiko; Chen, Jie; Mizuno, Sanae; Tsukamoto, Mitsuru

doi:10.2184/lsj.21.12_1266

Cited by 8 publications

(6 citation statements)

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“…In contrast, ε depends on both the optical sensor and data processing [12]. That is, the error can be further reduced by means of data smoothing; it is linearly proportional to 1/ √ n, where n is the number of times the data is smoothed [13]. The measurement error, i.e., experimental resolution δ, for this system was approximately δ = 12 µm since the normalized standard deviation was about ε = 0.018 based on these experimental results.…”

Section: Experimental Results Based On Laser Scatteringmentioning

confidence: 99%

Interaction Between Line Soliton andY-Periodic Soliton: Solutions to the Asymmetric Nizhnik–Novikov–Veselov Equation

Ruan¹

2003

Phys. Scr.

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A hybrid sensor for measuring longitudinal surface displacement including surface undulation and surface roughness over a wide range from nm to a few hundred µm has been developed. Two main sensors are incorporated in a single body, i.e., it is a hybrid system, with one sensor based on laser reflection for nm-scale measurement, while the other is based on imaging the irradiated portion for µm-scale measurement. A preliminary experiment using this hybrid sensor showed that the sensor for measuring surface undulation has a longitudinal resolution of 1 nm and a measurement frequency of 24 Hz, and that the sensor for measuring surface roughness has a longitudinal resolution of 2 µm, a measurement range of ±300 µm and a measurement frequency of a few hundred Hz. This hybrid sensor is relatively compact and its cost/performance ratio allows its practical use.

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Section: Experimental Results Based On Laser Scatteringmentioning

confidence: 99%

Interaction Between Line Soliton andY-Periodic Soliton: Solutions to the Asymmetric Nizhnik–Novikov–Veselov Equation

Ruan¹

2003

Phys. Scr.

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“…In a derivation of these equations, (3), (6), and (7), a light intensity in unit area is assumed to be constant over the pinhole plane. This assumption is not practically useful and causes discrepancies between analytical and experimental results.…”

Section: ( )mentioning

confidence: 99%

“…In this equation, the maximum error is considered, and the relation, (∆I p1 -∆I p2 )<<2I p , is assumed. Substituting equations (6) and 7into (11), the following relation can be obtained:…”

Section: Effect Of Error Regarding Received Light Intensity Onmentioning

confidence: 99%

“…As is well known, the noise power ε p can be reduced to ε p / n , by means of n times smoothing. 6,7) The method described in this study has the feature of high data acquisition because the surface displacement can be determined only in terms of light intensity. The sampling frequency of data acquisition of 10 kHz can easily be obtained by means of a 16 bit A/D converter and a silicon photodiode array on the market.…”

Section: Reduction Of Error By Means Of Smoothingmentioning

confidence: 99%

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Real Time Measurement of a Surface Displacement with Two Laser Beams

Kozuki

Honda

Sakurai

et al. 2004

The Review of Laser Engineering

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An optical method for measuring surface displacement in real time has been proposed by means of a system composed of two laser beams, and is discussed analytically using paraxial optics. The normalized light intensity defined by both the lights, I=(I1-I2) / (I1+I2), was expressed by I =-2(f1-f0) 2 (1/q) ∆f0, where f1 and f2 are the focal lengths of the first (objective) and second (focusing) lenses, q a distance between the pinhole and the focal point of the second lens for both laser beams, and ∆f 0 surface displacement. The above analytical result has been roughly verified by preliminary experiment, though there were differences in absolute intensity between the experimental and the analytical results. The spatial resolution of this method was expected to be about 2 µm from these analytical and experimental results.

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“…Thus, the smoothing by N samples decreases the fluctuation remarkably; the fluctuation is linearly proportional to 1/ N , when the sampling data have usually a normal distribution. 10,11) The angle Θ i can then be determined Fig. 2 Basic optics for measuring film thickness by means of laminar-like laser light.…”

Section: Determination Of θ Imentioning

confidence: 99%

A Practical System for Measuring Film Thickness by Means of Laser Interference with Laminar-Like Laser

Feng

Ishikawa

Ibe

et al. 2004

The Review of Laser Engineering

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A practical system for measuring a film thickness based on laser interferometry has been constructed using a laminar-like laser and a CCD camera. The system can measure a film thickness at a measuring frequency of 50 Hz, which enables real-time measurement in practical use. The measurable minimum thickness by means of a blue laser having a wavelength of 405 nm was 2.4 µm, and the maximum thickness was 1.2 mm for a film with a refractive index of 1.4. The measurement error of the film thickness due to the spherical aberration of the cylindrical lens was ∆h/h = 2% at maximum, where h expresses film thickness and ∆h its error amount.

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Thickness Measurement of Polyethylene Foam by Light Attenuation.

Cited by 8 publications

References 0 publications

Interaction Between Line Soliton andY-Periodic Soliton: Solutions to the Asymmetric Nizhnik–Novikov–Veselov Equation

Interaction Between Line Soliton andY-Periodic Soliton: Solutions to the Asymmetric Nizhnik–Novikov–Veselov Equation

Real Time Measurement of a Surface Displacement with Two Laser Beams

A Practical System for Measuring Film Thickness by Means of Laser Interference with Laminar-Like Laser

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