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The paper describes the fabrication and testing of thick film zinc oxide sensors that could be used to monitor the atomic oxygen fluence experienced by spacecraft in low Earth orbit, or that produced in ground-based atomic oxygen sources. Impedance spectroscopy measurements were carried out on the sensors to determine the conduction mechanisms within the thick films when exposed to atomic oxygen. The results indicate that the sensors' total resistance increases linearly with time when they are exposed to a constant flux of atomic oxygen, and that the sensors can be regenerated by heating.Index Terms-Atomic Oxygen, Space Environment, Thick film sensors, Zinc Oxide.
I. INTRODUCTIONAtomic oxygen (AO) is the main atmospheric constituent in Low Earth Orbit (LEO) at altitudes between 200-1000 km. Atomic oxygen is formed by the photo-dissociation of molecular oxygen by solar ultra-violet (UV) radiation [1]; at these altitudes the probability of recombination is low due to the low atmospheric density and hence the AO is a stable species. Despite its low density it is well known [2] that AO causes high levels of damage over time to many spacecraft materials, particularly those located on forward-facing (ram direction) surfaces. For example, silver electrical contacts are readily oxidised and become non-conducting whilst polymer thermal protection blankets may be eroded, causing their optical properties (emissivity and absorptivity) to change and thus affecting their performance. In both cases the damage processes are enhanced by the high collision energy (approx. 5 eV) of the AO. The AO flux (usually expressed as atoms cm -2 s -1 ) is highly variable, depending primarily on altitude and level of solar activity [1].As an example, for the International Space Station (ISS), residing in a roughly 330 km circular orbit, a typical AO flux J.C. Valer was a doctoral student at the University of Southampton. His contact details are:1 Rowleys Mill,