2009 International Conference on Applied Superconductivity and Electromagnetic Devices 2009
DOI: 10.1109/asemd.2009.5306671
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Thin film thickness measurement using electron probe microanalyzer

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Cited by 9 publications
(4 citation statements)
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“…The results were compared with other investigation techniques to evaluate its accuracy. Thickness results have an uncertainty of about 9% which is consistent with the data from literature obtained from calibration curves using real standards [38]. The three metals chosen for the coating had largely different characteristic X-ray emissions as they had different atomic numbers.…”
Section: Discussionsupporting
confidence: 84%
“…The results were compared with other investigation techniques to evaluate its accuracy. Thickness results have an uncertainty of about 9% which is consistent with the data from literature obtained from calibration curves using real standards [38]. The three metals chosen for the coating had largely different characteristic X-ray emissions as they had different atomic numbers.…”
Section: Discussionsupporting
confidence: 84%
“…The approach was validated by the analysis of electrodeposited plates with known metal thickness using various approaches and custom-made software. The results were compared with other techniques showing an uncertainty of 9%, which is consistent with the literature data obtained using real standards [133]. The method has been validated on copper-based substrates covered by a layer of gold-nickel alloy.…”
Section: Real Thickness Determinationsupporting
confidence: 76%
“…The elemental composition of a given material can be obtained from its EDS spectra [98]. As the detected energy intensity depends on the initial electron beam energy and the average volume of the droplet-shaped interaction region, EDS may also be employed to estimate the film thickness [70,[99][100][101][102]. Most authors use the relation I f /I s ∼ d, where I s (I f ) is the peak intensity of the substrate (film), to obtain the thickness.…”
Section: Appendix B: Sem/eds Characterizationmentioning
confidence: 99%