“…Those relations include the parameters of charge transfer, such as the parameter of specular reflection , the mean free path of electrons , and the parameter of grain-boundary scattering , which depends on the coefficient of electron scattering by grain boundaries, . When calculating the specific conductance on the basis of formulas (5) and (6), we used the parameters obtained earlier in our works [17][18][19], when analyzing the experimental dependences of the temperature coefficient of film resistance on the film thickness measured for Cu, Ni, and Co films. Besides that, the indicated parameters were calculated for the films of those metals with a coating making use of a linearized model and the Tellier-Tosser-Pichard (TTP) model of isotropic scattering [20].…”