1998
DOI: 10.1103/physrevb.57.6286
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Thomas-Fermi approximation inp-type δ-doped quantum wells of GaAs and Si

Abstract: Thomas-Fermi calculations of the hole subband structure in p-type ␦-doped Si and GaAs quantum wells are carried out for different values of impurity concentration. Results are compared with previous self-consistent calculations and with some experimental reports, and very good agreement is found. In particular, the result of hole ground level from this model is exactly equal to the value reported for the experimental system with the smallest impurity spreading that has been achieved. ͓S0163-1829͑98͒04507-X͔

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Cited by 44 publications
(39 citation statements)
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“…Details of the model can be found in Refs. [11,12]. Particular attention will be paid to the effect of the transition from direct to indirect gap as a result of the increasing applied pressure (see Table I).…”
Section: Introductionmentioning
confidence: 99%
“…Details of the model can be found in Refs. [11,12]. Particular attention will be paid to the effect of the transition from direct to indirect gap as a result of the increasing applied pressure (see Table I).…”
Section: Introductionmentioning
confidence: 99%
“…One of the earliest models of a δ-doped layer was the application of the Thomas-Fermi (TF) theory 13,18,19 to an n-type δ-layer, in general. 20 Later, this same TF method was applied to p-type δ-layers in GaAs and Si 21 and, combined with TB in a study of n-type δ-doped Si and B layers in GaAs. 22 Transport properties in ntype δ-layers in Si have also been studied using the TF method.…”
mentioning
confidence: 99%
“…At low temperatures, the Fermi level is located only very few meV obove the bands's edge [34,35]. Therefore is a good approximation to take it coinciding with the potential well vertex.…”
Section: Original Papermentioning
confidence: 98%