Abstract:Investigation of crystallography of crack planes has been a topic of interest for many decades. Understanding how cracks propagate is essential in improving fracture toughness by altering the microstructure and texture. This requires micro-/nano-analysis of grains along the crack path in three dimensions. Electron Backscattered Diffraction (EBSD) on cleavage fracture surfaces or in conjunction with serial-sectioning by Focused Ion Beam (FIB) has been previously utilized to locally study crack crystallography [… Show more
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