2017
DOI: 10.1017/s1431927617003361
|View full text |Cite
|
Sign up to set email alerts
|

Three-Dimensional Analysis of Cracks by Focused Ion Beam and Transmission Kikuchi Diffraction

Abstract: Investigation of crystallography of crack planes has been a topic of interest for many decades. Understanding how cracks propagate is essential in improving fracture toughness by altering the microstructure and texture. This requires micro-/nano-analysis of grains along the crack path in three dimensions. Electron Backscattered Diffraction (EBSD) on cleavage fracture surfaces or in conjunction with serial-sectioning by Focused Ion Beam (FIB) has been previously utilized to locally study crack crystallography [… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 12 publications
(14 reference statements)
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?