Three‐dimensional electron microscopy simulation with the CASINO Monte Carlo software

Abstract

Monte Carlo softwares are widely used to understand the capabilities of electron microscopes. To study more realistic applications with complex samples, 3D Monte Carlo softwares are needed. In this paper, the development of the 3D version of CASINO is presented. The software feature a graphical user interface, an efficient (in relation to simulation time and memory use) 3D simulation model, accurate physic models for electron microscopy applications, and it is available freely to the scientific community at this website: www.gel.usherbrooke.ca/casino/index.html. It can be used to model backscattered, secondary, and transmitted electron signals as well as absorbed energy. The software features like scan points and shot noise allow the simulation and study of realistic experimental conditions. This software has an improved energy range for scanning electron microscopy and scanning transmission electron microscopy applications.

Electron beam induced current in InSb-InAs nanowire type-III heterostructures

“…This fraction, collected by the upper electrode, is 30%-40% (for the lower electrode, the contact peak is partially overlapped with the signal from the NW and cannot be measured separately). It is in a good agreement with the results of direct Monte-Carlo simulation using the Casino v3.2 program, 8 confirming that the contacts of our composition and thickness absorb most of the 10 kV electron beam.…”

To see or not to see: Imaging surfactant coated nano-particles using HIM and SEM

“…In order to asses the yield and origin of secondary electrons as well as backscattered electrons in SEM, Monte Carlo simulations using CASINO [19] have been utilized. The sample was modeled using a 2 nm thick carbon layer on a 10 nm thick gold slab on top of a silicon substrate.…”

A versatile high‐vacuum cryo transfer system for cryo microscopy and analytics

“…To reveal the relationship between thickness and measured signal, the scattering process toward the sample material of known density and composition is simulated by a Monte Carlo software tool (33)(34)(35) that was introduced by Reichelt and Engel (36), and extended by Krzyzánek and Reichelt (37). Having simulated the scattering path of numerous electrons for a range of thicknesses, T, the software tool calculates the fraction of electrons N sca /N 0 that scatter toward the detector for each thickness.…”