Three-Dimensional Electron Microscopy Simulation with the CASINO Monte Carlo Software

Demers, Hendrix; Poirier-Demers, N; Jonge, Niels de; Drouin, Dominique

doi:10.1017/s143192761100393x

Cited by 46 publications

(61 citation statements)

References 2 publications

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“…39 Like in our experiments, the electron beam impinged on a model NP in the direction of its vertical (i.e., height) axis. For the simulations (Figure 3c), a 1.1 μm tall model NP was created by stacking 100 cylindrical slices, with each being 11 nm in thickness and 100 nm in diameter.…”

Section: ■ Results and Discussionmentioning

confidence: 68%

Direct-Write Deposition and Focused-Electron-Beam-Induced Purification of Gold Nanostructures

Belić

Shawrav

Gavagnin

et al. 2015

ACS Appl. Mater. Interfaces

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Three-dimensional gold (Au) nanostructures offer promise in nanoplasmonics, biomedical applications, electrochemical sensing and as contacts for carbon-based electronics. Direct-write techniques such as focused-electron-beam-induced deposition (FEBID) can provide such precisely patterned nanostructures. Unfortunately, FEBID Au traditionally suffers from a high nonmetallic content and cannot meet the purity requirements for these applications. Here we report exceptionally pure pristine FEBID Au nanostructures comprising submicrometer-large monocrystalline Au sections. On the basis of high-resolution transmission electron microscopy results and Monte Carlo simulations of electron trajectories in the deposited nanostructures, we propose a curing mechanism that elucidates the observed phenomena. The in situ focused-electron-beam-induced curing mechanism was supported by postdeposition ex situ curing and, in combination with oxygen plasma cleaning, is utilized as a straightforward purification method for planar FEBID structures. This work paves the way for the application of FEBID Au nanostructures in a new generation of biosensors and plasmonic nanodevices.

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Section: ■ Results and Discussionmentioning

confidence: 68%

Direct-Write Deposition and Focused-Electron-Beam-Induced Purification of Gold Nanostructures

Belić

Shawrav

Gavagnin

et al. 2015

ACS Appl. Mater. Interfaces

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“…The probability to excite 1, 2 and 3 plasmons is plotted in Figure 8 as a function of the diameter of a spherical Pd particle at 30 kV in (a) and the accelerating voltage for a 5 nm Pd particle in (b). The plasmon inelastic mean free path (Kotera et al , 1990) was determined using Monte‐Carlo simulations with the Casino 3.2 software (Hovington et al , 1997; Demers et al , 2011). The graph in Figure 8(a) suggests that the plasmon excitation probability decreases largely with the specimen thickness.…”

Section: Discussionmentioning

confidence: 99%

Nanometres‐resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope

Brodusch

Demers

Gauvin

2013

Journal of Microscopy

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Summary A charge‐coupled device camera of an electron backscattered diffraction system in a scanning electron microscope was positioned below a thin specimen and transmission Kikuchi patterns were collected. Contrary to electron backscattered diffraction, transmission electron forward scatter diffraction provides phase identification and orientation mapping at the nanoscale. The minimum Pd particle size for which a Kikuchi diffraction pattern was detected and indexed reliably was 5.6 nm. An orientation mapping resolution of 5 nm was measured at 30 kV. The resolution obtained with transmission electron forward scatter diffraction was of the same order of magnitude than that reported in electron nanodiffraction in the transmission electron microscope. An energy dispersive spectrometer X‐ray map and a transmission electron forward scatter diffraction orientation map were acquired simultaneously. The high‐resolution chemical, phase and orientation maps provided at once information on the chemical form, orientation and coherency of precipitates in an aluminium–lithium 2099 alloy.

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“…However, most MC simulations consider only the higher energy primary and BSEs with serial computation (Starý et al ., ; Walker et al ., ). CASINO has recently introduced SE simulation (Demers et al ., ). There have also been two approaches taken to introduce SE simulation using the package GEANT4 (Kieft and Bosch, ; Bernal et al ., ).…”

Section: Simulation Of Secondary Electronsmentioning

confidence: 97%

“…The Bohmian Quantum Trajectory method is more usually used for Quantum Molecular Dynamics or Quantum Hydrodynamic calculations (Towler, ). The Quantum MC (QMC) program CASINO which is used, for example, to carry out Quantum chemistry calculations (Towler, ) (not to be confused with the electron transport simulation program of the same name (Demers et al ., ) uses the Quantum Trajectory method. Pseudo potential methods of DFT cannot be used to simulate high energy electrons as these will penetrate into the inner core of atoms due to the use of pseudo‐potentials and this is where the DFT programs make their approximations.…”

Section: Introducing Quantum Mechanics To Monte Carlo Simulationsmentioning

confidence: 99%

Simulations and measurements in scanning electron microscopes at low electron energy

2016

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Summary: The advent of new imaging technologies in Scanning Electron Microscopy (SEM) using low energy (0-2 keV) electrons has brought about new ways to study materials at the nanoscale. It also brings new challenges in terms of understanding electron transport at these energies. In addition, reduction in energy has brought new contrast mechanisms producing images that are sometimes difficult to interpret. This is increasing the push for simulation tools, in particular for low impact energies of electrons. The use of Monte Carlo calculations to simulate the transport of electrons in materials has been undertaken by many authors for several decades. However, inaccuracies associated with the Monte Carlo technique start to grow as the energy is reduced. This is not simply associated with inaccuracies in the knowledge of the scattering cross-sections, but is fundamental to the Monte Carlo technique itself. This is because effects due to the wave nature of the electron and the energy band structure of the target above the vacuum energy level become important and these are properties which are difficult to handle using the Monte Carlo method. In this review we briefly describe the new techniques of scanning low energy electron microscopy and then outline the problems and challenges of trying to understand and quantify the signals that are obtained. The effects of charging and spin polarised measurement are also briefly explored. SCANNING 9999:1-17, 2016.

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Three-Dimensional Electron Microscopy Simulation with the CASINO Monte Carlo Software

Cited by 46 publications

References 2 publications

Direct-Write Deposition and Focused-Electron-Beam-Induced Purification of Gold Nanostructures

Direct-Write Deposition and Focused-Electron-Beam-Induced Purification of Gold Nanostructures

Nanometres‐resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope

Simulations and measurements in scanning electron microscopes at low electron energy

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