2014
DOI: 10.1117/12.2052452
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Three dimensional fabrication of optical waveguiding elements for on-chip integration

Abstract: We present micro polymer optical waveguide elements fabricated using femtosecond laser and two-photon absorption (TPA) process. The POWs are constructed by tightly focusing a laser beam in SU-8 based resists transparent to the laser wavelength for single-photon absorption. The TPA process enables the patterning of the resist in three dimensions at a resolution of 100-200 nm, which provides a high degree of freedom for POW designs. Using this technology, we provide a novel approach to fabricate Three dimensiona… Show more

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Cited by 2 publications
(2 citation statements)
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“…In contrast, ultrashort pulses (<10 ps) lead to limited heat‐affected zone. However, permanent modifications are extremely challenging to produce in the bulk and the exit surface of silicon with ultrashort laser pulses, [ 12 ] unless complex approaches are implemented for optimizing the spatial, [ 26–28 ] spectral, [ 29,30 ] or temporal [ 31–33 ] properties of the irradiation. These limitations originate from the high nonlinear refractive index of silicon (on the order of 10 −14 cm 2 W −1 [ 34,35 ] ), which causes micro‐filamentation at modest peak powers—and thus, an intensity clamping similar to that described for transparent media.…”
Section: Rationalementioning
confidence: 99%
“…In contrast, ultrashort pulses (<10 ps) lead to limited heat‐affected zone. However, permanent modifications are extremely challenging to produce in the bulk and the exit surface of silicon with ultrashort laser pulses, [ 12 ] unless complex approaches are implemented for optimizing the spatial, [ 26–28 ] spectral, [ 29,30 ] or temporal [ 31–33 ] properties of the irradiation. These limitations originate from the high nonlinear refractive index of silicon (on the order of 10 −14 cm 2 W −1 [ 34,35 ] ), which causes micro‐filamentation at modest peak powers—and thus, an intensity clamping similar to that described for transparent media.…”
Section: Rationalementioning
confidence: 99%
“…Several femtosecond studies were based on line scans. These resulted in a combination of surface damage and modifications at a shallow depth (k ¼ 0:8 lm) [26,27], modifications just below an oxide overcoat (k ¼ 2:4 lm) [20], a combination of surface damage and subsurface modifications at an unknown depth (k ¼ 1:55 lm) [28] and modifications near the back surface of a substrate (k ¼ 1:55 lm) [29]. In other femtosecond studies, single or multiple laser pulses were applied to a single location.…”
Section: Introductionmentioning
confidence: 99%