2021
DOI: 10.1107/s1600577521002903
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Three-dimensional fast elemental mapping by soft X-ray dual-energy focal stacks imaging

Abstract: The three-dimensional (3D) dual-energy focal stacks (FS) imaging method has been developed to quickly obtain the spatial distribution of an element of interest in a sample; it is a combination of the 3D FS imaging method and two-dimensional (2D) dual-energy contrast imaging based on scanning transmission soft X-ray microscopy (STXM). A simulation was firstly performed to verify the feasibility of the 3D elemental reconstruction method. Then, a sample of composite nanofibers, polystyrene doped with ferric acety… Show more

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Cited by 2 publications
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“…These three end stations have proven to be extremely useful for studies in environmental science [19,20], physics [21], chemical, materials, and energy sciences [22,23]. The BL08U1A beamline is capable of a variety of experimental methods, including imaging methods such as STXM [24,25], nano-CT [26][27][28], and ptychography [29,30], as well as XAS methods such as total electron yield (TEY), X-ray Magnetic Circular Dichroism (XMCD), X-ray Magnetic Linear Dichroism (XMLD), and X-ray-Excited Optical Luminescence (XEOL) [31,32]. In order to obtain satisfactory experimental results, XAS methods require the incident X-ray flux to be measured for data normalization, and all XAS and imaging methods require a high and stable incident X-ray light flux to improve the signal-to-noise ratio.…”
Section: System Designmentioning
confidence: 99%
“…These three end stations have proven to be extremely useful for studies in environmental science [19,20], physics [21], chemical, materials, and energy sciences [22,23]. The BL08U1A beamline is capable of a variety of experimental methods, including imaging methods such as STXM [24,25], nano-CT [26][27][28], and ptychography [29,30], as well as XAS methods such as total electron yield (TEY), X-ray Magnetic Circular Dichroism (XMCD), X-ray Magnetic Linear Dichroism (XMLD), and X-ray-Excited Optical Luminescence (XEOL) [31,32]. In order to obtain satisfactory experimental results, XAS methods require the incident X-ray flux to be measured for data normalization, and all XAS and imaging methods require a high and stable incident X-ray light flux to improve the signal-to-noise ratio.…”
Section: System Designmentioning
confidence: 99%