“…(Barnard et al, 2006, Batenburg et al, 2009, Mobus and Inkson, 2001, Weyland et al, 2006 The Dual Beam, Focused Ion Beam Scanning Electron Microscope (DB--FIB SEM) makes three--dimensional imaging and crystallography mapping possible at the submicron level. (Dillon and Rohrer, 2009b At larger length scales, X--ray tomography (Chen et al, 2010, Chino andDunand, 2008) and high energy X--ray diffraction microscopy (HEDM) (Hefferan et al, 2009, Larson et al, 2002, Poulsen et al, 2001) allow phase mapping and crystallographic mapping, respectively. Finally, at the largest length scale, "RoboMet" robotic polishing and metallography allows the three--dimensional imaging of samples with sizes up to the cm size range.…”