2015
DOI: 10.1016/j.sab.2014.12.006
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Three dimensional subsurface elemental identification of minerals using confocal micro-X-ray fluorescence and micro-X-ray computed tomography

Abstract: Current non-destructive elemental characterization methods, such as scanning electron microscopy-based energy dispersive spectroscopy (SEM-EDS) and micro X-ray fluorescence spectroscopy (MXRF), are limited to either elemental identification at the surface (SEM-EDS) or suffer from an inability to discriminate between surface or depth information (MXRF). Thus, a non-destructive elemental characterization of individual embedded particles beneath the surface is impossible with either of these techniques. This limi… Show more

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Cited by 19 publications
(11 citation statements)
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“…CXMFI provides compositional and structural information from precise locations on the surface of, and within, intact particles, with greater spatial precision than can be obtained using conventional micro x-ray fluorescence (µ-XRF) methods [18]. Limited applications of CXMFI are reported for natural materials; examples include the characterization of Se accumulation in fish eye lens [19]; W, Pt, and Fe in particles embedded in a mineralogical matrix [20]; K, Ca, and Fe in rice grains [21]; and U-Th-Pb for dating of geological materials [22].…”
Section: Introductionmentioning
confidence: 99%
“…CXMFI provides compositional and structural information from precise locations on the surface of, and within, intact particles, with greater spatial precision than can be obtained using conventional micro x-ray fluorescence (µ-XRF) methods [18]. Limited applications of CXMFI are reported for natural materials; examples include the characterization of Se accumulation in fish eye lens [19]; W, Pt, and Fe in particles embedded in a mineralogical matrix [20]; K, Ca, and Fe in rice grains [21]; and U-Th-Pb for dating of geological materials [22].…”
Section: Introductionmentioning
confidence: 99%
“…However, when the confocal 3D‐μXRF spectrometer used to retrieve the information covered in the printed paper, the powdered ink used in the printer must contain some element that could be detected by the confocal 3D‐μXRF setup and not contain in the paper. Last but not least, the application of the confocal 3D‐μXRF spectrometer could be expanded to the identification of the spatial distribution of metal elements of the painting, mineral, tablet, forensic sample, and so on …”
Section: Resultsmentioning
confidence: 99%
“…Los Alamos National Laboratory has a customdesigned confocal micro-XRF instrument. Micro-XRF spectrometry [8][9][10][11][12][13][14][15] measures the emitted X-ray photons of a material excited by an X-ray source. Our system uses a Mo tube (25 W), with a pair of polycapillary optics, one on the source and the other on the detector.…”
Section: Iid1 Particle Inclusion Identification Using Confocal Xrfmentioning
confidence: 99%