1988
DOI: 10.1007/bf00615918
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Threshold switching effects in AgTlSe2 and CuTlSe2 films

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Cited by 17 publications
(5 citation statements)
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“…The obtained values, given in Table 5 are in good agreement with those obtained for other amorphous semiconductor films [8,15,19,22,23]. Moreover, the agreement of the obtained values of the ratioε/E σ2 given in Table 4 with those values obtained earlier and derived theoretically [9] for the breakdown process, it can be concluded that the observed memory type switching can be interpreted on the basis of an electrothermal breakdown process.…”
Section: Temperature Dependence Ofv Thsupporting
confidence: 89%
“…The obtained values, given in Table 5 are in good agreement with those obtained for other amorphous semiconductor films [8,15,19,22,23]. Moreover, the agreement of the obtained values of the ratioε/E σ2 given in Table 4 with those values obtained earlier and derived theoretically [9] for the breakdown process, it can be concluded that the observed memory type switching can be interpreted on the basis of an electrothermal breakdown process.…”
Section: Temperature Dependence Ofv Thsupporting
confidence: 89%
“…Thus it is concluded that either heat treatment or aging for long periods may improve the switching properties. Such an improvement has been observed in some other amorphous chalcogenide semiconductors [3][4][5].…”
Section: Effect Of Heat Treatment and Aging On Threshold Voltagesupporting
confidence: 65%
“…The research on amorphous materials has been intensive due to their interesting electrical, optical and magnetic properties. Certain of these amorphous semiconductors show a sudden change in resistance, they are generally grouped as switching properties [1][2][3][4][5][6]. Glasses or amorphous materials consisting of elements such as As, S, Se, Te, Si and Ge are electronic rather than ionic conductors [7], although the resistivities are usually high.…”
Section: Introductionmentioning
confidence: 99%
“…According to Eq. (6) and using the value of E values of T breakdown were calculated for the investigated film compositions in the temperature range (297-333 K) are given in Table 5 and this agreement with those obtained for other amorphous semiconductor films [9,22,[42][43][44][45]. It can be concluded that the observed memory type switching can be interpreted on the basis of the electrothermal breakdown process.…”
Section: Temperature Dependence Of the Threshold Voltagev Thmentioning
confidence: 52%