“…THz radiation can be used in analysis of materials that affect minimum one of three THz wave parameters: refractive index, absorption coefficient or wave scattering (Mittleman, 2013). For GFRP elements, the THz technique can be applied for identification of defects like: gaps, delaminations (Ryu et al , 2016), burning on a material surface (Stoik et al , 2010) as well as inclusion of Teflon layers (Zhang et al , 2016), water (Mieloszyk et al , 2018a, b), oil and dust (Mieloszyk et al , 2018b). THz spectroscopy allows to inspect internal structure of material and determines the inclusion location also in the sample thickness direction, but the measurement time is significantly longer than for IRT.…”